Metrology Testing Services

Metrology Testing Laboratory Services

A variety of microscopy and spectroscopy tools are available for precise measurements from the nano to the meter scale. Standardized techniques are used for the essential characterization of materials- composition, microstructure, chemical or physical properties, and performance. Validated and widely recognized testing methodologies are used for chemical analysis, purity measurement, failure analysis, thermal testing, microstructure analysis, mechanical testing, etc. The use of a specific technique and the appropriate standard of measurement varies with the type of problem, related industry, and the material system.

From raw material testing, product testing, quality control, regulatory compliance to industry certifications, we strive to provide comprehensive solutions to make products safer, reliable, and compliant.

Some of the frequently used analytical services include:

• Atomic-scale microscopy
• Elemental analysis by Secondary Ion Mass Spectrometry (SIMS)
• Composition by spectroscopy such as FTIR, Raman, XRF, OES
• Chemical analysis for contaminations, chemistry, and synthesis
• Trace element analysis using GD-MS, ICP-MS, ICP-OES, and LIBS
• Surface analysis and packaging defects by profilometry, SAM, 3D X-ray
• Materials characterization using XRD, EXAFS, XPS, XRR
  

Metrology Testing Services

A range of metrology services are available:

• Atomic Force Microscopy (AFM)
• Particle Size Analysis Using an Air-Jet Sieve ()
• Atom probe tomography (APT)
• Auger Electron Spectroscopy (AES)
• Gas Absorption for Surface Area and Pore Size Analysis (BET & BJH)
• Colorimetry
• Cryogenic Transmission Electron Microscopy (Cryo-TEM)
• Differential Hall Effect Metrology (DHEM)
• Dilatometry (Dilatometry)
• Dynamic Mechanical Analysis (DMA)
• Destructive Physical Analysis (DPA)
• Differential Scanning Calorimetry (DSC)
• Dual Beam – Focused Ion Beam (Dual Beam – FIB)
• Electron Beam Induced Current (EBIC)
• Electron Backscatter Diffraction (EBSD)
• Energy Dispersive X-ray Spectroscopy (EDS)
• Electron Energy Loss Spectroscopy (EELS)
• Evolved Gas Analysis (EGA)
• Electrochemical Analysis (Electrochemical)
• Ellipsometry (Ellipsometry)
• Emissivity (Emissivity)
• Electrothermal Vaporization (ICP) 
• Optical Emission Spectroscopy (ETV-ICP-OES)
• Fourier Transform Infrared Spectroscopy (FTIR)
• Gas chromatography (GC)
• Gas Chromatography-Mass Spectrometry (GC-MS)
• Gas Chromatography-Tandem Mass Spectrometry (GC-MS/MS)
• Glow Discharge Mass Spectrometry (GDMS)
• Gel Permeation Chromatography (GPC)
• Hydrogen Forward Scattering Spectrometry (HFS)
• High-Performance Liquid Chromatography (HPLC)
• High-Resolution Mass Spectrometry (HRMS)
• Ion Chromatography (IC)
• Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
• Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES)
• Instrumental Gas Analysis (IGA)
• Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS)
• Laser Diffractometry (Laser Diffraction)
• Liquid Chromatography-Mass Spectrometry (LC-MS)
• Laser-Induced Breakdown Spectroscopy (LIBS)
• Matrix-Assisted Laser Desorption/Ionization (MALDI)
• Nanoindentation for Nanomechanical Testing (Nanoindentation)
• Nuclear Magnetic Resonance Spectroscopy (NMR)
• Nuclear Reaction Analysis (NRA)
• Optical Profilometry (OP)
• Advanced Optical Microscopy
• Laser Confocal Microscopy
• Chromatic Dispersion Ellipsometry (FRT)
• White Light Interferometry 
• Wide Area 3D Patterned Light Measurement
• Particle Induced X-Ray Emission (PIXE)
• Particle Size Analysis (PSA)
• DYNAMIC LIGHT SCATTERING (DLS)
• PARTICLE COUNTING (SP1 / SP3) BY SURFSCAN
• ZETA POTENTIAL
• Pyrolysis Gas Chromatography-Mass Spectrometry (Pyro-GC-MS)
• Raman Spectrometry (Raman)
• Rutherford Backscattering Spectrometry (RBS)
• Refractometry
• Residual Gas Analysis (RGA)
• Rheology and Rheometry
• X-Ray Computed Tomography
• Real-Time X-ray (RTX)
• Scanning Acoustic Microscopy (SAM)
• Scanning Electron Microscopy (SEM)
• Scanning Electron Microscopy – Cathodoluminescence (SEM-CL)
• Secondary Ion Mass Spectrometry (SIMS)
• Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM) (TEM-STEM)
• Tensiometry (Tensiometry)
• Thermogravimetry/Evolved Gas Analysis (TG-EGA)
• Titrimetry (Titrimetry)
• Thin-Layer Chromatography (TLC)
• Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
• Total Reflection X-ray Fluorescence (TXRF)
• Ultraviolet-Visible Near-Infrared Spectroscopy (UV-VIS-NIR)
• Viscosity (Viscosity)
• X-ray Photoelectron Spectroscopy (XPS Spectroscopy) or Electron Spectroscopy for Chemical Analysis (ESCA) (XPS-ESCA)
• X-Ray Powder Diffraction (XRD)
• X-Ray Fluorescence (XRF)
• X-Ray Reflectivity (XRR)