Testing labs under Infinita Lab material testing laboratory network conduct raw material testing, product testing, quality control, and ensure regulatory compliance to industry certifications for our clients based in the USA and other countries across the globe. We ensure safe and reliable products.
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Metrology Testing Laboratory Services
A variety of microscopy and spectroscopy tools are available for precise measurements from the nano to the meter scale in our metrology testing laboratory. Standardized techniques are used for the essential characterization of materials- composition, microstructure, chemical or physical properties, and performance. Validated and widely recognized testing methodologies are used for chemical analysis, purity measurement, failure analysis, thermal testing, microstructure analysis, and mechanical testing. The use of a specific technique and the appropriate standard of measurement varies with the type of problem, related industry, and material system.
From raw material testing, product testing, quality control, regulatory compliance to industry certifications, our laboratory strives to provide comprehensive solutions to make products safer, reliable, and compliant.
Metrology testing experts at Infinita Lab assist our clients based in the USA and other countries across the globe in choosing the most appropriate test strategies, that are performed in our testing labs, to ensure that all projects are accurate, timely, and cost-effective.
Some of the frequently used analytical services include:
Atomic-scale microscopy
Elemental analysis by Secondary Ion Mass Spectrometry (SIMS)
Composition by spectroscopy such as FTIR, Raman, XRF, OES
Chemical analysis for contaminations, chemistry, and synthesis
Trace element analysis using GD-MS, ICP-MS, ICP-OES, and LIBS
Surface analysis and packaging defects by profilometry, SAM, 3D X-ray
Materials characterization using XRD, EXAFS, XPS, XRR
Metrology Testing Services
A range of metrology services are available:
Atomic Force Microscopy (AFM)
Particle Size Analysis Using an Air-Jet Sieve ()
Atom probe tomography (APT)
Auger Electron Spectroscopy (AES)
Gas Absorption for Surface Area and Pore Size Analysis (BET & BJH)
Colorimetry
Cryogenic Transmission Electron Microscopy (Cryo-TEM)
Differential Hall Effect Metrology (DHEM)
Dilatometry (Dilatometry)
Dynamic Mechanical Analysis (DMA)
Destructive Physical Analysis (DPA)
Differential Scanning Calorimetry (DSC)
Dual Beam – Focused Ion Beam (Dual Beam – FIB)
Electron Beam Induced Current (EBIC)
Electron Backscatter Diffraction (EBSD)
Energy Dispersive X-ray Spectroscopy (EDS)
Electron Energy Loss Spectroscopy (EELS)
Evolved Gas Analysis (EGA)
Electrochemical Analysis (Electrochemical)
Ellipsometry (Ellipsometry)
Emissivity (Emissivity)
Electrothermal Vaporization (ICP)
Optical Emission Spectroscopy (ETV-ICP-OES)
Fourier Transform Infrared Spectroscopy (FTIR)
Gas chromatography (GC)
Gas Chromatography-Mass Spectrometry (GC-MS)
Gas Chromatography-Tandem Mass Spectrometry (GC-MS/MS)
Glow Discharge Mass Spectrometry (GDMS)
Gel Permeation Chromatography (GPC)
Hydrogen Forward Scattering Spectrometry (HFS)
High-Performance Liquid Chromatography (HPLC)
High-Resolution Mass Spectrometry (HRMS)
Ion Chromatography (IC)
Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
X-ray Photoelectron Spectroscopy (XPS Spectroscopy) or Electron Spectroscopy for Chemical Analysis (ESCA) (XPS-ESCA)
X-Ray Powder Diffraction (XRD)
X-Ray Fluorescence (XRF)
X-Ray Reflectivity (XRR)
FEATURED SERVICES
See Best Metrology Testing Services
Secondary Ion Mass Spectroscopy – SIMS
Secondary Ion Mass Spectrometry - SIMS Testing Services Secondary Ion Mass Spectroscopy (SIMS) is a tool for the composition analysis of metals, semiconductors, polymers, biomaterials, minerals, rocks, and ceramics. As...
Optical Profilometry
Optical Profilometry Testing Optical Profilometry (OP) or White Light Interferometry (WLI) is an interferometric-based non-contact technology for the measurement of surface topography. It is used to measure surface roughness, coating...
X-Ray Fluorescence Spectroscopy-XRF
X-Ray Fluorescence Spectroscopy XRF is an elemental and chemical analysis tool. Handheld XRF is particularly useful for inspection and quick nondestructive analysis of large objects such as automotive parts, archaeological,...
Select Other Metrology Testing Services From Catalogue
Infinita Lab’s metrology services include a variety of microscopy and spectroscopy tools for precise measurements from the nano to the meter scale. Please contact us for a detailed quote for your testing needs.
Standardized metrology techniques are used for the essential characterization of materials- composition, microstructure, chemical or physical properties, and performance.
Metrology includes validated and widely recognized testing methodologies for chemical analysis, purity measurement, failure analysis, thermal testing, microstructure analysis, mechanical testing, etc. The use of a specific technique and the appropriate standard of measurement varies with the type of problem, related industry, and the material system.
