Metrology Testing Lab

Metrology Testing Laboratory Services

A variety of microscopy and spectroscopy tools are available for precise measurements from nano to meter scale in our partner metrology testing laboratories. Standardized techniques are used for the essential characterization of materials- composition, microstructure, chemical or physical properties, and performance. Validated and widely recognized testing methodologies are used for chemical analysis, purity measurement, failure analysis, thermal testing, microstructure analysis, and mechanical testing. The use of a specific technique and the appropriate standard of measurement varies with the type of problem, related industry, and material system.

From raw material testing, product testing, quality control, regulatory compliance to industry certifications, our laboratory strives to provide comprehensive solutions to make products safer, reliable, and compliant.

Metrology testing experts at Infinita Lab assist our clients based in the USA and other countries across the globe in choosing the most appropriate test strategies, that are performed in our testing labs, to ensure that all projects are accurate, timely, and cost-effective.

Some of the frequently used analytical services include:

• Atomic-scale microscopy
• Elemental analysis by Secondary Ion Mass Spectrometry (SIMS)
• Composition by spectroscopy such as FTIR, Raman, XRF, OES
• Chemical analysis for contaminations, chemistry, and synthesis
• Trace element analysis using GD-MS, ICP-MS, ICP-OES, and LIBS
• Surface analysis and packaging defects by profilometry, SAM, 3D X-ray
• Materials characterization using XRD, EXAFS, XPS, XRR

Metrology Testing Laboratory

A range of metrology services are available:

• Atomic Force Microscopy (AFM)
• Atom probe tomography (APT)
• Auger Electron Spectroscopy (AES)
• Colorimetry
• Cryogenic Transmission Electron Microscopy (Cryo-TEM)
• Differential Hall Effect Metrology (DHEM)
• Dilatometry (Dilatometry)
• Dynamic Mechanical Analysis (DMA)
• Destructive Physical Analysis (DPA)
• Differential Scanning Calorimetry (DSC)
• Dual Beam – Focused Ion Beam (Dual Beam – FIB)
• Electron Beam Induced Current (EBIC)
• Electron Backscatter Diffraction (EBSD)
• Energy Dispersive X-ray Spectroscopy (EDS)
• Electron Energy Loss Spectroscopy (EELS)
• Evolved Gas Analysis (EGA)
• Electrochemical Analysis (Electrochemical)
• Ellipsometry (Ellipsometry)
• Emissivity (Emissivity)
• Optical Emission Spectroscopy (ETV-ICP-OES)
• Fourier Transform Infrared Spectroscopy (FTIR)
• Gas Chromatography-Mass Spectrometry (GC-MS)
• Gas Chromatography-Tandem Mass Spectrometry (GC-MS/MS)
• Glow Discharge Mass Spectrometry (GDMS)
• Gel Permeation Chromatography (GPC)
• Hydrogen Forward Scattering Spectrometry (HFS)
• High-Performance Liquid Chromatography (HPLC)
• High-Resolution Mass Spectrometry (HRMS)
• Ion Chromatography (IC)
• Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
• Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES)
• Instrumental Gas Analysis (IGA)
• Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS)
• Laser Diffractometry (Laser Diffraction)
• Liquid Chromatography-Mass Spectrometry (LC-MS)
• Laser-Induced Breakdown Spectroscopy (LIBS)
• Matrix-Assisted Laser Desorption/Ionization (MALDI)
• Nanoindentation for Nanomechanical Testing (Nanoindentation)
• Nuclear Magnetic Resonance Spectroscopy (NMR)
• Nuclear Reaction Analysis (NRA)
• Optical Profilometry (OP)
• Particle Induced X-Ray Emission (PIXE)
• Pyrolysis Gas Chromatography-Mass Spectrometry (Pyro-GC-MS)
• Raman Spectrometry (Raman)
• Rutherford Backscattering Spectrometry (RBS)
• Refractometry
• Residual Gas Analysis (RGA)
• Real-Time X-ray (RTX)
• Scanning Acoustic Microscopy (SAM)
• Scanning Electron Microscopy (SEM)
• Scanning Electron Microscopy – Cathodoluminescence (SEM-CL)
• Secondary Ion Mass Spectrometry (SIMS)
• Tensiometry (Tensiometry)
• Thermogravimetry/Evolved Gas Analysis (TG-EGA)
• Titrimetry (Titrimetry)
• Thin-Layer Chromatography (TLC)
• Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
• Total Reflection X-ray Fluorescence (TXRF)
• Viscosity (Viscosity)
• X-Ray Powder Diffraction (XRD)
• X-Ray Fluorescence (XRF)
• X-Ray Reflectivity (XRR)