X-ray Photoelectron Spectroscopy – XPS
X-ray photoelectron spectroscopy (XPS) is a surface-sensitive elemental analysis technique. It is a powerful tool for determining the elemental and chemical state information of specimen surfaces.
X-ray photoelectron spectroscopy (XPS) is a surface-sensitive elemental analysis technique. It is a powerful tool for determining the elemental and chemical state information of specimen surfaces.
X-ray photoelectron spectroscopy (XPS) is a surface-sensitive elemental analysis technique. It is a powerful tool for determining the elemental and chemical state information of specimen surfaces. Combined with ion milling, XPS can be applied to depth profiling of thin films, detecting surface contamination of materials, inspecting surface treatments, and other surface characterization in the nanoscale. Its applicability in material characterization is far-reaching from inorganic compounds, metal alloys, polymers, glasses, biomaterials, ion modified materials, coatings, ceramics to semiconductors, etc.
In XPS, a sample is irradiated with the monochromatic x-rays that result in the emission of inner orbital and bonding electrons. The measurement of these electrons binding energies and intensities (from the top 1–10 nm of the sample) allows identification and quantification of the elements on the material’s surface.
X-ray Photoelectron Spectroscopy (XPS) Common Uses
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X-ray Photoelectron Spectroscopy (XPS) Laboratories
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Our network of material testing labs regularly provides X-ray photoelectron spectroscopy (XPS) testing services for surface analysis of organic and inorganic materials.
Surface or bulk survey scans of materials with X-ray photoelectron spectroscopy (XPS) start at $300/sample.
X-ray photoelectron spectroscopy (XPS) is a surface analysis technique used to obtain elemental composition (parts per thousand), empirical formula, chemical and electronic state of the elements present within the sample. It is also frequently used to detect surface contaminants in samples. It is suitable for ceramics, glasses, polymers, semiconductors, metals, composite materials, etc.
X-ray photoelectron spectroscopy (XPS) can detect all elements except He and H.
ASTM E572 test method covers the analysis of stainless and alloy steels by Wavelength Dispersive X-ray Fluorescence Spectrometry (WDXRF). It provides rapid, multi-element determinations with sufficient accuracy to assure product quality.
The ASTM D2674 is a standard test method for the analysis of sulfochromate etches solution used in the surface preparation of aluminum. The ASTM D2674 standard specifies a method for determining the efficacy of an etchant used to prepare the surface of aluminum alloys for subsequent adhesive bonding.
An immunological method for quantization of Hevea Natural Rubber (HNRL) proteins using rabbit anti-HNRL serum. Rabbits immunized with HNRL proteins react to the majority of the proteins present, and their sera have the capability to detect most if not all the proteins in HNRL.
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