Transmission Electron Microscopy or TEM is a powerful tool for imaging, spectroscopy, and diffraction analysis. A Transmission Electron Microscope is the most powerful microscopic instrument available and it is used to produce images of electron beam interaction with a sample. TEM performed in our testing labs helps to determine atomic-level structural characteristics of materials required for product design and application.
Before we understand what is TEM or Transmission Electron Microscopy, we need to understand that TEM is a powerful tool for imaging, spectroscopy, and diffraction analysis. TEM is a powerful microscopy technique used in testing labs, in which a beam of electrons is allowed to transmit through an ultra-thin specimen in order to interact with the atoms of the specimen. This electron beam generates a highly magnified image of the atoms it interacts with. The images obtained allow us to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. It is possible to image the atomic arrangement of the materials (1-2 A resolution), atomic defects, variation in a lattice arrangement across boundaries, chemical or composition changes, determine the crystal structure and orientation, etc. The elemental distribution could be quantified and mapped.
In TEM, electrons transmitted through a specimen are analyzed. High energy electrons interact with the specimen to produce various signals such as x-rays, elastically and inelastically scattered electrons, Auger, backscattered electrons, etc. containing different information about the specimen.
Our testing labs are well equipped to carry out all the routine and tailor-made Transmission Electron Microscopy analyses for the benefit of our clients based in the USA and other parts of the world. Our testing lab experts work tirelessly to provide a world-class TEM testing experience.
Common Uses of Transmission Electron Microscopy (TEM)
Advantages of Transmission Electron Microscopy (TEM)
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TEM analysis requires specialized tools and skillset. Experts at Infinita Lab provide transmission electron microscopy (TEM) test services to support you in investigating the surface structure and identifying defects.
The cost of the TEM analysis starts from $600/sample.
TEM allows high-resolution imaging with a magnification up to 50 million times. It is used for magnifying objects, to investigate the ultrastructure of organic and inorganic samples including microorganisms, cells, large molecules, metals, and crystals. It is used for identifying defects, impurities, grain boundaries, and determining phases, and their orientations. It is used to determine chemical composition at the point of interest with Energy Dispersive X-ray Spectroscopy (EDS) or Electron energy loss spectroscopy (EELS) detectors with the STEM mode.
Transmission electron microscopy (TEM) uses transmitted electrons to create images, while SEM uses deflected electrons from the sample. Scanning electron microscopy (SEM) is great for 2D and 3D surface imaging to detect roughness and contamination. However, if you are interested in analyzing grain boundaries and structural defects, nanoscale imaging with TEM is the go-to technique.
ASTM E572 test method covers the analysis of stainless and alloy steels by Wavelength Dispersive X-ray Fluorescence Spectrometry (WDXRF). It provides rapid, multi-element determinations with sufficient accuracy to assure product quality.
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An immunological method for quantization of Hevea Natural Rubber (HNRL) proteins using rabbit anti-HNRL serum. Rabbits immunized with HNRL proteins react to the majority of the proteins present, and their sera have the capability to detect most if not all the proteins in HNRL.
ASTM G65 measures the resistance of metallic materials to abrasion using the dry sand/rubber wheel apparatus. The quality, durability, and toughness of the sample are determined using this test. Metallic materials are ranked in their resistance to scratching abrasion under a controlled environment.
ASTM E2141 test methods provide accelerated aging and monitoring of the performance of time-dependent electrochromic devices (ECD) integrated in insulating glass units (IGU). This test helps to understand the relative serviceability of electrochromic glazings applied on ECD.
ASTM C724 test method is used in analyzing the quality and ease of maintenance of a ceramic decoration on architectural-type glass. This test method is useful in the acknowledgment of technical standards.
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