Transmission Electron Microscopy – TEM

Transmission Electron Microscopy

Before we understand what is TEM or Transmission Electron Microscopy, we need to understand that TEM is a powerful tool for imaging, spectroscopy, and diffraction analysis. TEM is a powerful microscopy technique used in testing labs, in which a  beam of electrons is allowed to transmit through an ultra-thin specimen in order to interact with the atoms of the specimen. This electron beam generates a highly magnified image of the atoms it interacts with. The images obtained allow us to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries. It is possible to image the atomic arrangement of the materials (1-2 A resolution), atomic defects, variation in a lattice arrangement across boundaries, chemical or composition changes, determine the crystal structure and orientation, etc. The elemental distribution could be quantified and mapped.

In TEM, electrons transmitted through a specimen are analyzed. High energy electrons interact with the specimen to produce various signals such as x-rays, elastically and inelastically scattered electrons, Auger, backscattered electrons, etc. containing different information about the specimen.

Our testing labs are well equipped to carry out all the routine and tailor-made Transmission Electron Microscopy analyses for the benefit of our clients based in the USA and other parts of the world. Our testing lab experts work tirelessly to provide a world-class TEM testing experience.

Video 01: Transmission Electron Microscopy (TEM)