(888) 878-3090
Scanning electron microscopy (SEM) is a surface analysis method that is widely used to determine the surface characteristics of sub-micron sized particles. With the diminishing working scales of materials used in various industries like microelectronics, SEM has far-reaching applications like semiconductor inspections, microchip assembly, failure analysis, and quality control. Laboratory professionals at Infinita Lab guarantee the optimum application of the SEM technology for general and targeted testing of your products, providing the best performance, lower warranty costs, and high levels of customer satisfaction.
Scanning electron microscopy (SEM) is a surface analysis technique frequently used in material testing labs to identify surface features of sub-micron size particles. It is best suited for the analysis of surface fractures, surface contaminants, microstructures, spatial variations in chemical compositions, and crystalline structures. It uses a focused beam of electrons, which is reflected or knocked off the surface or near-surface of the sample to generate high-resolution images. With the working scales in materials getting smaller in industries like microelectronics, SEM has far-reaching applications like semiconductor inspections, microchip assembly, failure analysis, quality control, etc.
In the scanning electron microscope test, electron-sample interaction generates secondary electrons (SE), backscattered electrons (BSE), and characteristic X-rays. SE and BSE detectors are used to capture these interactions to visualize the samples’ morphological and topographical information in the laboratory. BSE images are also used for the rapid discrimination of the phases in multiphase samples. An Energy Dispersive X-ray Spectroscopy (EDS) detector within SEM is used in the testing labs to detect the characteristic X-rays and provide qualitative and quantitative elemental analysis of the sample. Environmental SEM (ESEM) is another variant of the scanning electron microscope test available for analyzing the samples containing water or other volatile substances. 2D elemental mapping and 3D reconstruction of samples are available with FIB-SEM technology.
In order for SEM samples to resist the high vacuum conditions and the high intensity electron beam, they must be tiny enough to fit on the specimen stage and may need specific processing to improve their electrical conductivity and stability. Typically, a conductive adhesive is used to fix samples rigidly on a specimen holder or stub.
SEM is not a camera, and unlike a CCD array or film, the detector does not continuously create images. The resolution is not constrained by the diffraction limit, the fineness of lenses or mirrors, or the detector array resolution, as it is in an optical system. The SE detector is fist-sized and only senses electricity; the focusing optics may be large and coarse.
In contrast to SPMs, SEMs do not inherently produce 3D pictures. However, by combining SEM with the below methods, 3D data can be obtained:
Video 01: Scanning Electron Microscopy (SEM)
Scanning Electron Microscopy (SEM) Common Uses
There is a large variety of scanning electron microscope tests available for our clients based in the USA. All the tests are done in the best-equipped testing laboratory for utmost client satisfaction.
Advantages of SEM Tests
Limitations of SEM Tests
Industries Utilizing SEM Tests
More Details
hello@infinitalab.com
Enter Sample and testing requirementsProvide your contact information
Attach file
Δ
Secondary Ion Mass Spectrometry - SIMS Testing Services Secondary Ion Mass Spectroscopy (SIMS) is a tool for the composition analysis...
Optical Profilometry Testing Optical Profilometry (OP) or White Light Interferometry (WLI) is an interferometric-based non-contact technology for the measurement of...
XRF Testing, X-Ray Fluorescence Spectroscopy Testing Facility XRF is an elemental and chemical analysis tool. Handheld XRF is particularly useful...
EELS analysis of gate and channel is performed on fin field-effect transistors (finFETs). Scanning transmission electron…
FTIR analysis is used to study the migration and leaching of phthalate plasticizers from p-PVCs. Phthalate…
Nano-scale surface roughness is a critical parameter in fabricated thin-films that are used in optics, solar…
Start Testing
SEM analysis is one of the most commonly requested tests at Infinita Lab. We provide SEM services for elemental analysis and for detecting surface flaws, fractures, and contaminants.
Sample preparation and imaging with scanning electron microscopy (SEM) start from $275 per sample surface.
Scanning electron microscopy (SEM) is used for identifying surface flaws, fractures, and contaminants, at the microscale, by producing high-resolution images of a sample’s surface. It is also used for determining the elemental composition of a sample’s surface.
Scanning electron microscopy (SEM) analysis includes surface and near-surface topography and Z-contrast imaging. Further investigative studies include 2D or 3D imaging, and elemental mapping using FIB-SEM (Focused Ion Beam Scanning Electron Microscope) technology and EDS (energy-dispersive) detector.
ASTM E572 test method covers the analysis of stainless and alloy steels by Wavelength Dispersive X-ray Fluorescence Spectrometry (WDXRF). It provides rapid, multi-element determinations with sufficient accuracy to assure product quality.
The ASTM D2674 test is a standard test method for the analysis of sulfochromate etch solutions used in the surface preparation of aluminum. The ASTM D2674 standard specifies a method for determining the efficacy of an etchant used to prepare the surface of aluminum alloys for subsequent adhesive bonding.
An immunological method for quantization of Hevea Natural Rubber (HNRL) proteins using rabbit anti-HNRL serum. Rabbits immunized with HNRL proteins react to the majority of the proteins present, and their sera have the capability to detect most if not all the proteins in HNRL.
ASTM G65 measures the resistance of metallic materials to abrasion using the dry sand/rubber wheel apparatus. The quality, durability, and toughness of the sample are determined using this test. Metallic materials are ranked in their resistance to scratching abrasion under a controlled environment.
ASTM E2141 test methods provide accelerated aging and monitoring of the performance of time-dependent electrochromic devices (ECD) integrated in insulating glass units (IGU). This test helps to understand the relative serviceability of electrochromic glazings applied on ECD.
ASTM C724 test method is used in analyzing the quality and ease of maintenance of a ceramic decoration on architectural-type glass. This test method is useful in the acknowledgment of technical standards.
You share material and testing requirements with us
You ship your sample to us or arrange for us to pick it up.
We deliver the test report to your email.
Let’s work together!
Share your testing requirements with us and we will be happy to assist you.
What Material or product do you have?
What analysis do you need?
How many parts or coupons do you have?
How fast do you need the results back?
Do you know the goal of the analysis you need?
Contact Information
Name
E-mail
Contact number
Query
Submit