Scanning Electron Microscopy – SEM
Scanning electron microscopy (SEM) is a surface analysis technique frequently used to identify surface features of sub-micron size particles. With the diminishing working scales of materials used in various industries like microelectronics, SEM has far-reaching applications like semiconductor inspections, microchip assembly, failure analysis, and quality control. Laboratory experts at Infinita Lab assure the best use of SEM technique for routine and specific testing of your products, ensuring the best performance, reduced warranty costs, and high satisfaction levels.
Average 30% Cost