X-Ray Diffraction – XRD
XRD is a characterization technique used for crystalline materials. X-ray diffraction patterns are unique to the periodi c atomic arrangements in a specimen and are widely used for phase identification.... Read More
XRD is a characterization technique used for crystalline materials. X-ray diffraction patterns are unique to the periodi c atomic arrangements in a specimen and are widely used for phase identification.... Read More
XRD is a characterization technique used for crystalline materials. X-ray diffraction patterns are unique to the periodic atomic arrangements in a specimen and are widely used for phase identification. In a diffractometer, incident X-rays are scattered (diffracted) at specific angles from the sample’s lattice planes, resulting in diffraction peaks characteristic of simple’s crystal structure. The diffraction patterns give information like phase, atomic plane spacing (d-spacing), crystal structure, preferred orientation (texture), average grain size, crystallinity, strain, crystallite size, crystal defects, etc.
XRD is used extensively for mineral exploration, identification of new and unknown materials, substrate characterization in integrated circuit production, protein crystallography, solid-state drug analysis, etc. Various XRD configurations are available to suit the type of application.
XRD Variants:
XRD Variants
XRD Common Uses
Advantages
Limitations
Industries
Microelectronics
Semiconductors
Thin-films and coatings
Glass Manufacturing
Heavy Metals and Alloys
Energy storage and Batteries
Nanomaterials
Polymers
Forensic Science
Geology
Automotive Materials
Pharmaceuticals
Biomedical Research
Materials Research
XRD Laboratories
Evans Analytical Group (EAG) Laboratories
Element Materials Technology
Intertek Group Plc.
Attard’s Minerals
S&N Labs
EMSL Analytical, Inc.
Applied Technical Services
More Details
Understanding X-ray diffraction
Basics of X-ray powder diffraction
XRD at Nano-scale
Our network of material testing labs regularly provides X-ray diffraction (XRD) testing for the crystallography of single-crystal substrates, characterizes pharmaceuticals, trace element analysis, etc. for a wide range of samples and industries.
Phase ID and qualitative analysis of materials with X-ray diffraction (XRD) start from $350/sample.
X-ray diffraction (XRD) is used to measure the crystalline content of materials; identify the crystalline phases present; determine the spacing between lattice planes and the length scales over which they persist, and study preferential ordering and epitaxial growth of crystallites from angstroms to nanoscales.
Both operate on the same working principles of X-ray scattering. While X-ray fluorescence (XRF) provides the sample’s chemical composition and is used for rapid surface analysis of samples, X-ray diffraction (XRD) is often used to identify the crystalline phases, differentiate oxidation states, and obtain other crystallographic information.
ASTM E572 test method covers the analysis of stainless and alloy steels by Wavelength Dispersive X-ray Fluorescence Spectrometry (WDXRF). It provides rapid, multi-element determinations with sufficient accuracy to assure product quality.
The ASTM D2674 is a standard test method for the analysis of sulfochromate etches solution used in the surface preparation of aluminum. The ASTM D2674 standard specifies a method for determining the efficacy of an etchant used to prepare the surface of aluminum alloys for subsequent adhesive bonding.
An immunological method for quantization of Hevea Natural Rubber (HNRL) proteins using rabbit anti-HNRL serum. Rabbits immunized with HNRL proteins react to the majority of the proteins present, and their sera have the capability to detect most if not all the proteins in HNRL.
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