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Atomic Force Microscopy (AFM) is a non-optical surface topographic analysis technique with high lateral (nm), vertical (Aº), and force (pN) resolution. AFM is used to obtain high-resolution nanoscale images and study loc al sites of micro/nanostructured coatings and surfaces.... Read More
Atomic Force Microscopy (AFM) is a non-optical surface topographic technique with high lateral (nm), vertical (Aº), and force (pN) resolution. It is used in testing labs for better resolution visualization of nanostructures, such as thin films, nanoparticles, microelectronics, polymers, and cellular components. AFM is also used in a laboratory to make quantitative measurements at the nanoscale and subnanoscale, including surface roughness and step-heights. Atomic Force Microscopy is built on the principles of scanning probe microscopy. AFM is used in the different modes for the qualitative mapping of mechanical properties (friction, adhesion), physical properties (size, morphology, surface texture, roughness), electrical properties (capacitance, conductivity, resistance, surface potential), and magnetic properties of material surfaces.
In AFM, a cantilever with a nanoscale tip scans across the sample surface and uses the atomic forces to map the tip-sample interaction. The most commonly used modes of AFM are contact, non-contact, and dynamic (tapping) modes.
Our testing labs carry out Atomic Force Microscopy (AFM) efficiently to provide the best results to our clients based in the USA and other parts of the world. We at Infinita Lab perform not only routine tests, but also custom tests designed in our testing labs as per the client’s specific requirements.
Video 01: Atomic Force Microscopy (AFM)
Common Uses of AFM
Advantages of AFM
Limitations of AFM
Industries benefitted by AFM Technique
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Atomic Force Microscopy (AFM) is a non-optical surface topographic analysis technique with high lateral (nm), vertical (Aº), and force (pN) resolution. In AFM, a cantilever with a nanoscale tip scans across the sample surface and uses atomic forces to map the tip-sample interaction.
AFM is used in testing labs for better resolution visualization of nanostructures, such as thin films, nanoparticles, microelectronics, polymers, and cellular components. It is also used in a laboratory to make quantitative measurements at the nanoscale and subnanoscale, including surface roughness and step-heights.
AFM microscopes are used for the qualitative mapping of mechanical properties (friction, adhesion), physical properties (size, morphology, surface texture, roughness), electrical properties (capacitance, conductivity, resistance, surface potential), and magnetic properties of material surfaces.
The three types of AFM scanning modes are: 1. Tapping mode 2. Contact mode 3. Non-contact mode
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