Secondary Ion Mass Spectrometry (SIMS) is used for the composition analysis of metals, semiconductors, polymers, biomaterials, minerals, rocks, and ceramics using a mass spectrometer. SIMS is the preferred tool for deter mining the composition of solid surfaces and thin films in testing labs.... Read More
Secondary Ion Mass Spectroscopy (SIMS) is a tool for the composition analysis of metals, semiconductors, polymers, biomaterials, minerals, rocks, and ceramics. As the name suggests, SIMS uses a mass spectrometer to analyze secondary ions ejected after primary ions are bombarded on the sample surface. In the laboratory, SIMS can detect almost all elements in the periodic table, from Hydrogen to Uranium, in very low concentrations and with high lateral resolution. Thus, it is useful for dopants, impurities, and trace element analysis.
Static and Dynamic SIMS are two modes differentiated by whether only the top layer of the solid or a depth (from nm to a few tens of micron) is probed. These modes are accomplished by changing the primary ion beam’s dose i.e. a low dose ion beam only knocks out atoms from the top monolayer while a high dose beam goes through several layers. Time-of-flight (ToF-SIMS), quadrupole, and magnetic sector mass spectrometers options are available in combination with modes.
Our well-equipped testing labs perform SIMS analysis for our clients based in the USA and other parts of the world. We at Infinita Lab perform not only routine tests, but also custom tests designed in our laboratory as per the client’s specific requirements.
Common Uses of SIMS
Limitations of SIMS
Industries benefitted by SIMS analysis
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Our network of material testing labs, spread across the USA, provides SIMS analysis services to identify the substance present on the sample’s surface and to detect defects and impurities.
The cost of surface scans of materials using ToF-SIMS starts from $450/sample.
Scanning ion mass spectrometry (SIMS) is an imaging technique coupled with a spectrometer. It is used to obtain elemental, isotopic, and molecular information from solid samples. It is also used for depth profiling, imaging, and compositional analysis of surface defects and contaminants.
Static and dynamic SIMS models differ in the ion beam type, sample sputtering intensity, and the information obtained. Static SIMS, like ToF-SIMS, uses a low ion beam dose suitable to obtain compositional information on the sample’s outermost layer.
ASTM E572 test method covers the analysis of stainless and alloy steels by Wavelength Dispersive X-ray Fluorescence Spectrometry (WDXRF). It provides rapid, multi-element determinations with sufficient accuracy to assure product quality.
The ASTM D2674 test is a standard test method for the analysis of sulfochromate etch solutions used in the surface preparation of aluminum. The ASTM D2674 standard specifies a method for determining the efficacy of an etchant used to prepare the surface of aluminum alloys for subsequent adhesive bonding.
An immunological method for quantization of Hevea Natural Rubber (HNRL) proteins using rabbit anti-HNRL serum. Rabbits immunized with HNRL proteins react to the majority of the proteins present, and their sera have the capability to detect most if not all the proteins in HNRL.
ASTM G65 measures the resistance of metallic materials to abrasion using the dry sand/rubber wheel apparatus. The quality, durability, and toughness of the sample are determined using this test. Metallic materials are ranked in their resistance to scratching abrasion under a controlled environment.
ASTM E2141 test methods provide accelerated aging and monitoring of the performance of time-dependent electrochromic devices (ECD) integrated in insulating glass units (IGU). This test helps to understand the relative serviceability of electrochromic glazings applied on ECD.
ASTM C724 test method is used in analyzing the quality and ease of maintenance of a ceramic decoration on architectural-type glass. This test method is useful in the acknowledgment of technical standards.
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