Nano-scale roughness measurement of Si-wafers by Atomic Force Microscopy (AFM)
Fabricated thin films require smooth nano-scale surfaces for effective usage. Infinitalab offers different types of high precision surface measurements using AFM and other cutting-edge techniques to monitor surface roughness on fabricated thin film substrates.
Nano-scale surface roughness is a critical parameter in fabricated thin-films that are used in optics, solar cells, data storage, and semiconductor electronics. One such example is for optimizing growth conditions to achieve atomically smooth films on Si-wafers. AFM is used for high-precision surface measurements to monitor surface roughness on substrates. The thicknesses of these layers are in the range of a few to 50 nm. Minute variations in growth conditions can influence the uniformity of these layers compromising the component’s performance.
In the below example, AFM imaging is used to assess pre-treatment times and their effect on surface roughness. Figure 1 shows the root mean square (RMS) surface roughness of Si-wafers with varying pre-treatment durations. As seen here, AFM can show topographical variations in the range of 10-1 nm with three-dimensional spatial resolution.
[1] Kim, C., Kim, Y., Ryu, H., Kang, J., Kim, S., Min, B., & Lee, H. (2007). Wall-Controlled Growth of CNTs for X-ray Electron Sources. Journal of the Korean Physical Society, 51, 193-197.
ASTM E572 test method covers the analysis of stainless and alloy steels by Wavelength Dispersive X-ray Fluorescence Spectrometry (WDXRF). It provides rapid, multi-element determinations with sufficient accuracy to assure product quality.
The ASTM D2674 test is a standard test method for the analysis of sulfochromate etch solutions used in the surface preparation of aluminum. The ASTM D2674 standard specifies a method for determining the efficacy of an etchant used to prepare the surface of aluminum alloys for subsequent adhesive bonding.
An immunological method for quantization of Hevea Natural Rubber (HNRL) proteins using rabbit anti-HNRL serum. Rabbits immunized with HNRL proteins react to the majority of the proteins present, and their sera have the capability to detect most if not all the proteins in HNRL.
ASTM G65 measures the resistance of metallic materials to abrasion using the dry sand/rubber wheel apparatus. The quality, durability, and toughness of the sample are determined using this test. Metallic materials are ranked in their resistance to scratching abrasion under a controlled environment.
ASTM E2141 test methods provide accelerated aging and monitoring of the performance of time-dependent electrochromic devices (ECD) integrated in insulating glass units (IGU). This test helps to understand the relative serviceability of electrochromic glazings applied on ECD.
ASTM C724 test method is used in analyzing the quality and ease of maintenance of a ceramic decoration on architectural-type glass. This test method is useful in the acknowledgment of technical standards.
Loading Comments...
Send us a request
Process for testing
STEP 01
You share material and testing requirements with us
STEP 02
You ship your sample to us or arrange for us to pick it up.
STEP 03
We deliver the test report to your email.
Just share your testing requirements and leave the rest on us!
Free, no-obligation consultation
Guaranteed confidentiality
Quick turnaround time
Hassle-free process
Let us combine our capabilities to achieve success!!