Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) generates secondary ions from the surface of a sample by bombardment with a beam of high energy primary ions. The resulting secondary ions of various analyte species are then identified by Time of Flight Mass spectrometry. Surface composition as well as near surface depth profiles can be obtained. ... Read More