Scanning Electron Microscopy – Cathodoluminescence (SEM-CL)
SEM-Cathodoluminescence (SEM-CL) is used to characterize solid Insulators and Semiconductors, by spectral analysis of Cathodoluminescence induced by bombardment of the sample by high energy electrons from a Scanning Electron Microscope. The Infinita Lab network of testing labs, USA, offers the SEM-CL test to our clients in the USA and worldwide.
Average 30% Cost Savings
100% Confidentiality Guarantee
Free, No-obligation Consultation
100% Customer Satisfaction
TRUSTED BY ENGINEERS FROM
Scanning Electron Microscopy- Cathodoluminescence (SEM-CL)
SEM-Cathodoluminescence (SEM-CL) microscopy is based upon the characteristic Cathodoluminescence (CL) from a solid material, when excited by high-energy electron bombardment from a Scanning Electron Microscope (SEM). Cathodoluminescence can be explained by the band theory, in which electron populations in solids are confined to discrete energy bands, ranging from Valence to Conduction bands. In the case of solid Insulators and Semiconductors the band gap is sufficiently high, to prevent electrons from jumping easily from the Valence to Conduction bands. The electron bombardment of such a sample, during SEM-CL microscopy, transfers enough energy to Valence band electrons to jump up to the Conduction band. When the electrons fall back to the ground state, they may encounter impurities or structural defects that temporarily trap them (for microseconds). When the electrons vacate the trap to return to ground state, the energy lost may be of a wavelength that results in luminescence. This emission characterizes the impurity or structural defect. Actually, CL is a complex function of lattice structure, composition, structural defects, temperature and strain. In SEM-CL measurements, the emissions of interest are in the visible range of the electromagnetic spectrum (wavelengths of 400-700 nm), though some may occur in the UV and IR ranges. The intensity of emission is recorded by a CL detector and spectrum of intensity versus wavelength obtained. SEM-CL can be used either in focused mode to obtain spot spectra or the sample can be scanned, to obtain images that provide spatially averaged spectra.
SEM-CL is used in mineralogy, geology, ceramics, semiconductors and nanotechnology for detection of impurities, trace elements and microstructural defects.
Common Uses of SEM-CL
Analysis of semiconductors
Analysis of ceramics
Study of surface plasmon resonances in metallic Nanoparticles.
In mineralogy and geology to study rocks, minerals and fossils
Advantages of SEM-CL
High sensitivity and spatial resolution
Provides spot as well as spatially averaged images and spectra
Limitations of SEM-CL
Interferences due to Fluorescence and Phosphorescence
ASTM E572 test method covers the analysis of stainless and alloy steels by Wavelength Dispersive X-ray Fluorescence Spectrometry (WDXRF). It provides rapid, multi-element determinations with sufficient accuracy to assure product quality.
The ASTM D2674 is a standard test method for the analysis of sulfochromate etches solution used in the surface preparation of aluminum. The ASTM D2674 standard specifies a method for determining the efficacy of an etchant used to prepare the surface of aluminum alloys for subsequent adhesive bonding.
An immunological method for quantization of Hevea Natural Rubber (HNRL) proteins using rabbit anti-HNRL serum. Rabbits immunized with HNRL proteins react to the majority of the proteins present, and their sera have the capability to detect most if not all the proteins in HNRL.
ASTM G65 measures the resistance of metallic materials to abrasion using the dry sand/rubber wheel apparatus. The quality, durability, and toughness of the sample are determined using this test. Metallic materials are ranked in their resistance to scratching abrasion under a controlled environment.
ASTM E2141 test methods provide accelerated aging and monitoring of the performance of time-dependent electrochromic devices (ECD) integrated in insulating glass units (IGU). This test helps to understand the relative serviceability of electrochromic glazings applied on ECD.
ASTM C724 test method is used in analyzing the quality and ease of maintenance of a ceramic decoration on architectural-type glass. This test method is useful in the acknowledgment of technical standards.
Send us a request
Process for testing
STEP 01
You share material and testing requirements with us
STEP 02
We ensure your sample pick-up in an ensured manner
STEP 03
We deliver test report to your inbox
Just share your testing requirements and leave the rest on us!