Scanning Electron Microscopy – Cathodoluminescence (SEM-CL)
SEM-Cathodoluminescence (SEM-CL) is used to characterize solid Insulators and Semiconductors, by spectral analysis of Cathodoluminescence induced by bombardment of the sample by high energy electrons from a Scanning Electron Microscope. The Infinita Lab network of testing labs, USA, offers the SEM-CL test to our clients in the USA and worldwide. ... Read More