Optical Profilometry

Optical Profilometry (OP) is a non-contact technique to measure surface topography. An optical profilometer is used to evaluate roughness statistics and feature dimensions of a sample through 2D and 3D images. Infinita Labs provides routine and advanced OP analyses using state-of-the-art technology. Optical Profilometry is a non-destructive technique to analyze surface roughness, coating thickness variation, flatness, surface curvature, texture, and thin-film coating stress of samples using an optical profilometer. ... Read More

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    Optical Profilometry Testing

    Optical Profilometry (OP) or White Light Interferometry (WLI) is an interferometric-based non-contact technology for the measurement of surface topography. It is used to measure surface roughness, coating thickness variation, flatness, surface curvature, texture, and thin-film coating stress. It’s a non-destructive and relatively fast method with a wide range of applications. A diamond stylus is scanned on the sample’s surface in a contact mode profilometer while its vertical movement is recorded. In contrast, a non-contact mode profilometer uses a laser or optical beam. The light beam is split with one half directed to the surface and another half to the mirror. When these beams are recombined, the wavelength scale path difference produced by the topography variations causes interference. Contour information is extrapolated from the interpretation of the interference patterns.

    We at Infinita Lab are committed to providing the best routine and advanced OP analyses for our clients based in the USA and across the world. Our testing laboratory has various state-of-the-art instruments and methodologies to perform profilometry experiments.

    Some of the variants available for more frequently used optical profilometry include:

    • Laser Confocal Microscopy
    • Patterned Light and Wide Area 3D Measurements
    • White Light Interferometry

    Optical Profilometry Common Uses

    • Roughness profile for automotive parts
    • Curvature analysis for thin-film stress measurement, adhesion, etc.
    • Coating surface characteristics
    • Corrosion on the metal surfaces
    • Fabric surface morphology
    • Imaging of cracks and other surface defects
    • Flip chip and other semiconductor packaging flatness and solder bumps
    • Measurement of the radius of curvature for optical parts and nanometric surface features2
    • Development of high precision die

    Optical Profilometry Advantage

    • Does not require a vacuum or special chamber
    • Can accommodate very large to small samples
    • Surface roughness precision in the sub-nanometer range

    Optical Profilometry Limitations

    • Considerable variation in the surface height hard to measure
    • A variation in the refractive index of films can produce erroneous thickness estimations.

    Optical Profilometry Industries

    • Semiconductors
    • Nanotechnology
    • Additive Manufacturing
    • Advanced Packaging
    • Advanced Materials
    • Automotive
    • LED and Display
    • Biomaterials
    • Optical Component Manufacturing

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      FAQs on Optical Profilometry

      Where can I get an optical profilometry test done for my raw material?

      Our network of material testing laboratories, spread across the USA, regularly provides optical profilometry (OP) services for routine surface topography analysis, thickness measurements, 3D imaging, along specific tests designed to suit your requirements.

      How much would an optical profilometry analysis cost me?

      High-resolution optical profilometry analysis starts from $200 per sample.

      What is the use of optical profilometry tests?

      Optical profilometry (OP)  technique is utilized to obtain surface profile information about most of the materials. Surface topography characteristics like critical dimensions, step height, peak-to-valley, volume, and coating thickness mapping are measured using this technique.

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