Optical Profilometry

Optical Profilometry (OP) is a non-contact technique to measure surface topography. Through 2D and 3D pictures, an optical profilometer is used to assess a sample's roughness statistics and feature size. Using an optical profilometer, optical profilometry is a non-destructive method of analyzing samples' surface roughness, coating thickness fluctuation, flatness, surface curvature, texture, and thin-film coating stress. Infinita Labs uses cutting-edge technology to provide routine and sophisticated OP analyses. ... Read More

Average 30% Cost
Savings
100% Confidentiality
Guarantee
Free, No-obligation
Consultation
100% Customer
Satisfaction

TRUSTED BY ENGINEERS FROM

Optical Profilometry Testing

Optical Profilometry (OP) or White Light Interferometry (WLI) is an interferometric-based non-contact technology for the measurement of surface topography. It is used to measure surface roughness, coating thickness variation, flatness, surface curvature, texture, and thin-film coating stress. It’s a non-destructive and relatively fast method with a wide range of applications. A diamond stylus is scanned on the sample’s surface in a contact mode profilometer while its vertical movement is recorded. In contrast, a non-contact mode profilometer uses a laser or optical beam. The light beam is split with one half directed to the surface and another half to the mirror. When these beams are recombined, the wavelength scale path difference produced by the topography variations causes interference. Contour information is extrapolated from the interpretation of the interference patterns.

An optical profiler can be useful in a wide range of scientific and industrial examination disciplines. It is possible to measure surface forms over wider areas using devices with lesser spatial resolution.

The performance of the profilometer is crucial for an accurate analysis of the surface topography; therefore, the following crucial elements must be taken into account:

Resolution in space: For various profilometers, the resolution in space varies, notably in the longitudinal and lateral directions. The range of this spatial resolution is determined by the users’ goals, which in turn are determined by the various accuracy levels.
Field of view: The whole area of the material surface that the profilometer can measure is known as the field of view. This depends on the kind of profiler and its size in order to comprehend the characteristics of the larger area.
Picture acquisition time: The profilometer’s other key performance indicator is dependent on the measurement technique, the needed image type, image frame rates, and accuracy.

Video 01: Stylus Profilometry vs. Optical Profilometry

Optical Profilometry Common Uses

Roughness profile for automotive parts
Curvature analysis for thin-film stress measurement, adhesion, etc.
Coating surface characteristics
Corrosion on the metal surfaces
Fabric surface morphology
Imaging of cracks and other surface defects
Flip chip and other semiconductor packaging flatness and solder bumps
Measurement of the radius of curvature for optical parts and nanometric surface features2
Development of high precision die

Optical Profilometry Advantage

Does not require a vacuum or special chamber
Can accommodate very large to small samples
Surface roughness precision in the sub-nanometer range

Optical Profilometry Limitations

Considerable variation in the surface height hard to measure
A variation in the refractive index of films can produce erroneous thickness estimations.

Optical Profilometry Industries

Semiconductors
Nanotechnology
Additive Manufacturing
Advanced Packaging
Advanced Materials
Automotive
LED and Display
Biomaterials
Optical Component Manufacturing

More Details

Featured Metrology Testing Services

Secondary Ion Mass Spectroscopy – SIMS Secondary Ion Mass Spectrometry - SIMS Testing Services Secondary Ion Mass Spectroscopy (SIMS) is a tool for the composition analysis of metals, semiconductors, polymers, biomaterials, minerals, rocks, and ceramics. As...

Optical Profilometry Optical Profilometry Testing Optical Profilometry (OP) or White Light Interferometry (WLI) is an interferometric-based non-contact technology for the measurement of surface topography. It is used to measure surface roughness, coating...

X-Ray Fluorescence Spectroscopy – XRF X-Ray Fluorescence Spectroscopy Testing Facility XRF is an elemental and chemical analysis tool. Handheld XRF is particularly useful for inspection and quick nondestructive analysis of large objects such as automotive...

Did not find your required test? Contact Us

TRUSTED BY ENGINEERS FROM

FAQs on Optical Profilometry

Where can I get an optical profilometry test done for my raw material?

Our network of material testing laboratories, spread across the USA, regularly provides optical profilometry (OP) services for routine surface topography analysis, thickness measurements, 3D imaging, along specific tests designed to suit your requirements.

How much would an optical profilometry analysis cost me?

High-resolution optical profilometry analysis starts from $200 per sample.

What is the use of optical profilometry tests?

Optical profilometry (OP) technique is utilized to obtain surface profile information about most of the materials. Surface topography characteristics like critical dimensions, step height, peak-to-valley, volume, and coating thickness mapping are measured using this technique.

Recently Searched by other expert

Materials Testing

ASTM E572 Analysis of Stainless and Alloy Steels by WDXRF

ASTM E572 test method covers the analysis of stainless and alloy steels by Wavelength Dispersive X-ray Fluorescence Spectrometry (WDXRF). It provides rapid, multi-element determinations with sufficient accuracy to assure product quality.

ASTM D2674 Analysis of Sulfochromate Etch Solution

The ASTM D2674 test is a standard test method for the analysis of sulfochromate etch solutions used in the surface preparation of aluminum. The ASTM D2674 standard specifies a method for determining the efficacy of an etchant used to prepare the surface of aluminum alloys for subsequent adhesive bonding.

Antigenic Protein in Hevea Natural Rubber ASTM D6499

An immunological method for quantization of Hevea Natural Rubber (HNRL) proteins using rabbit anti-HNRL serum. Rabbits immunized with HNRL proteins react to the majority of the proteins present, and their sera have the capability to detect most if not all the proteins in HNRL.

ASTM Standards

ASTM G65 Abrasion Test Using the Dry Sand/Rubber Wheel Apparatus

ASTM G65 measures the resistance of metallic materials to abrasion using the dry sand/rubber wheel apparatus. The quality, durability, and toughness of the sample are determined using this test. Metallic materials are ranked in their resistance to scratching abrasion under a controlled environment.

ASTM E2141 Accelerated Aging of Electrochromic Devices in Sealed Glass Units

ASTM E2141 test methods provide accelerated aging and monitoring of the performance of time-dependent electrochromic devices (ECD) integrated in insulating glass units (IGU). This test helps to understand the relative serviceability of electrochromic glazings applied on ECD.

ASTM C724 Acid Resistance of Ceramic Decoration on Architectural Glass

ASTM C724 test method is used in analyzing the quality and ease of maintenance of a ceramic decoration on architectural-type glass. This test method is useful in the acknowledgment of technical standards.