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Optical Profilometry (OP) is a non-contact technique to measure surface topography. Through 2D and 3D pictures, an optical profilometer is used to assess a sample's roughness statistics and feature size. Using an optical profilometer, optical profilometry is a non-destructive method of analyzing samples' surface roughness, coating thickness fluctuation, flatness, surface curvature, texture, and thin-film coating stress. Infinita Labs uses cutting-edge technology to provide routine and sophisticated OP analyses.
Optical Profilometry (OP) or White Light Interferometry (WLI) is an interferometric-based non-contact technology for the measurement of surface topography. It is used to measure surface roughness, coating thickness variation, flatness, surface curvature, texture, and thin-film coating stress. It’s a non-destructive and relatively fast method with a wide range of applications. A diamond stylus is scanned on the sample’s surface in a contact mode profilometer while its vertical movement is recorded. In contrast, a non-contact mode profilometer uses a laser or optical beam. The light beam is split with one half directed to the surface and another half to the mirror. When these beams are recombined, the wavelength scale path difference produced by the topography variations causes interference. Contour information is extrapolated from the interpretation of the interference patterns.
An optical profiler can be useful in a wide range of scientific and industrial examination disciplines. It is possible to measure surface forms over wider areas using devices with lesser spatial resolution.
The performance of the profilometer is crucial for an accurate analysis of the surface topography; therefore, the following crucial elements must be taken into account:
Video 01: Stylus Profilometry vs. Optical Profilometry
Optical Profilometry Common Uses
Optical Profilometry Advantage
Optical Profilometry Limitations
Optical Profilometry Industries
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Our network of material testing laboratories, spread across the USA, regularly provides optical profilometry (OP) services for routine surface topography analysis, thickness measurements, 3D imaging, along specific tests designed to suit your requirements.
High-resolution optical profilometry analysis starts from $200 per sample.
Optical profilometry (OP) technique is utilized to obtain surface profile information about most of the materials. Surface topography characteristics like critical dimensions, step height, peak-to-valley, volume, and coating thickness mapping are measured using this technique.
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