(888) 878-3090
Electron Backscatter Diffraction (EBSD) is a microstructural analysis technique for crystalline materials. EBSD uses the diffraction patterns of an incident electron beam, from a scanning electron microscope (SEM), to obtain crystallographic information. The laboratory network of Infinita Lab, USA, offers this test to clients in the USA and other places.
Electron Backscatter Diffraction (EBSD) is a technique used for crystal structure analysis using the diffraction patterns of an incident electron beam, focused on the sample from a scanning electron microscope (SEM). The diffracted electrons impinge on a phosphor screen placed near the sample, where they generate visible lines called Electron Backscatter Diffraction (EBSD) patterns or Kikuchi Diffraction Bands. The technique involves placing the crystalline sample in the SEM, at a suitable angle to the incident electron beam, along with the phosphor screen located close to the sample to detect the diffraction patterns. A digital camera captures the EBSD patterns which are processed by a computer. Since the diffraction patterns represent the projections of lattice planes in the crystal onto the flat phosphor screen, they provide information on crystal orientation, allow differentiation between different crystalline phases, indicate grain boundaries, and local crystal defects. Individual grains, aggregates or multiple crystal phases near the surface of the sample can be investigated. In fact, thousands of individual grains and individual spots can be scanned using EBSD, in a few hours. It is possible to obtain images with a resolution level of several microns.
EBSD with the use of SEM is an important tool for collecting crystallographic information routinely on a range of natural and synthetic crystalline materials like metals, ceramics, rocks, ice and semiconductors.
Common Uses of Electron Backscatter Diffraction (EBSD)
Advantages of Electron Backscatter Diffraction (EBSD)
Limitations of Electron Backscatter Diffraction (EBSD)
Industrial Applications of Electron Backscatter Diffraction (EBSD)
hello@infinitalab.com
Enter Sample and testing requirementsProvide your contact information
Attach file
Δ
EELS analysis of gate and channel is performed on fin field-effect transistors (finFETs). Scanning transmission electron…
FTIR analysis is used to study the migration and leaching of phthalate plasticizers from p-PVCs. Phthalate…
Nano-scale surface roughness is a critical parameter in fabricated thin-films that are used in optics, solar…
Start Testing
Electron Backscatter Diffraction (EBSD) is a technique used for crystal structure analysis using the diffraction patterns of an incident electron beam, focused on the sample from a scanning electron microscope (SEM). The diffracted electrons impinge on a phosphor screen placed near the sample, where they generate visible lines called Electron Backscatter Diffraction (EBSD) patterns or Kikuchi Diffraction Bands.
EBSD is an acronym for Electron Back-Scatter Diffraction, a microstructural analysis technique for crystalline materials.
o Measurements of Grain size, Grain boundary characterization, local and global texture o Crystalline boundary characterization o Substructure analysis o Phase identification and distributions o Phase transformation studies o Fracture analysis
Kikuchi lines are patterns formed by electrons when they scatter.
ASTM E572 test method covers the analysis of stainless and alloy steels by Wavelength Dispersive X-ray Fluorescence Spectrometry (WDXRF). It provides rapid, multi-element determinations with sufficient accuracy to assure product quality.
The ASTM D2674 test is a standard test method for the analysis of sulfochromate etch solutions used in the surface preparation of aluminum. The ASTM D2674 standard specifies a method for determining the efficacy of an etchant used to prepare the surface of aluminum alloys for subsequent adhesive bonding.
An immunological method for quantization of Hevea Natural Rubber (HNRL) proteins using rabbit anti-HNRL serum. Rabbits immunized with HNRL proteins react to the majority of the proteins present, and their sera have the capability to detect most if not all the proteins in HNRL.
ASTM G65 measures the resistance of metallic materials to abrasion using the dry sand/rubber wheel apparatus. The quality, durability, and toughness of the sample are determined using this test. Metallic materials are ranked in their resistance to scratching abrasion under a controlled environment.
ASTM E2141 test methods provide accelerated aging and monitoring of the performance of time-dependent electrochromic devices (ECD) integrated in insulating glass units (IGU). This test helps to understand the relative serviceability of electrochromic glazings applied on ECD.
ASTM C724 test method is used in analyzing the quality and ease of maintenance of a ceramic decoration on architectural-type glass. This test method is useful in the acknowledgment of technical standards.
You share material and testing requirements with us
You ship your sample to us or arrange for us to pick it up.
We deliver the test report to your email.
Let’s work together!
Share your testing requirements with us and we will be happy to assist you.
What Material or product do you have?
What analysis do you need?
How many parts or coupons do you have?
How fast do you need the results back?
Do you know the goal of the analysis you need?
Contact Information
Name
E-mail
Contact number
Query
Submit