Atom Probe Tomography (APT)

Atom probe tomography (APT) is an analytical technique that provides three-dimensional chemical maps of atomic species in metals, ceramics, semiconductors and composites at sub-nanometre resolution. Our clients in the USA and across the world can have this test done using the vast network of testing labs from Infinita Lab, USA.

Talk to an Expert

TRUSTED BY

Precision-driven testing for dimensional accuracy and compliance

Overview
Scope, Applications, and Benefits
Test Process
Specifications
Instrumentation
Results and Deliverables

Overview

Atom Probe Tomography is a highly advanced microscopy and analysis technique used to identify the 3D atomic structure of materials. It is a technique whereby a strong electric field is applied to a needle-shaped sample of material, causing atoms to evaporate from its surface.

APT is a highly advanced microscopy and analysis technique with very high resolution, allowing scientists to identify the location of atoms within a given material. It is commonly used to study materials at the atomic level across various fields, including materials science, nanotechnology, metallurgy, semiconductors, and advanced alloys.

Scope, Applications, and Benefits

Scope

Atom Probe Tomography is used to analyze the atomic composition and spatial distribution of elements within materials at near-atomic resolution. The technique enables detailed investigation of nanoscale structures and interfaces.

The scope includes:

Atomic-scale elemental composition analysis
Three-dimensional atomic structure mapping
Analysis of nanomaterials and alloys
Characterization of thin films and interfaces
Detection of trace elements and impurities

Applications

Semiconductor and microelectronics research
Metallurgy and alloy development
Nanomaterials characterization
Thin film and interface analysis
Materials failure and defect investigation

Benefits

Provides near-atomic resolution imaging
Enables 3D reconstruction of atomic structures
Detects very small concentrations of elements
Helps study nanoscale material behavior
Supports advanced materials research and development

Test Process

Sample Preparation

The material is prepared into a very sharp needle-shaped specimen, often using focused ion beam techniques.

Field Evaporation

A strong electric field combined with laser or voltage pulses causes atoms to evaporate from the sample surface.

Ion Detection

The evaporated ions travel to a position-sensitive detector that records their identity and location.

3D Reconstruction

The detected data is processed to reconstruct a three-dimensional atomic map of the material.

Technical Specifications

Parameter	Details
Spatial Resolution	Sub-nanometer to atomic scale
Detection Method	Time-of-flight mass spectrometry
Sample Shape	Needle-shaped specimen (~50–100 nm tip radius)
Operating Environment	Ultra-high vacuum
Ion Source	Field evaporation using voltage or laser pulses
Analysis Capability	Elemental identification and 3D mapping
Output Data	Atomic position and composition maps

Instrumentation Used for Testing

Atom Probe Tomography System
Laser or Voltage Pulse Generator
Position-Sensitive Ion Detector
Ultra-High Vacuum Chamber
Data Reconstruction and Analysis Software

Results and Deliverables

3D atomic structure reconstruction
Elemental composition mapping
Detection of impurities and nano-segregation
Interface and phase analysis
Detailed atomic-scale characterization report

Partnering with Infinita Lab for Optimal Results

Infinita Lab addresses the most frustrating pain points in the Atom Probe Tomography testing process: complexity, coordination, and confidentiality. Our platform is built for secure, simplified support, allowing engineering and R&D teams to focus on what matters most: innovation. From kickoff to final report, we orchestrate every detail—fast, seamlessly, and behind the scenes.

Looking for a trusted partner to achieve your research goals? Schedule a meeting with us, send us a request, or call us at (888) 878-3090 to learn more about our services and how we can support you. Request a Quote

Frequently Asked Questions

Atom Probe Tomography is an advanced microscopy technique that identifies and maps individual atoms in a material, allowing researchers to study its three-dimensional atomic structure and elemental composition.

APT provides near-atomic spatial resolution and precise chemical identification, allowing researchers to visualize the exact position of atoms and analyze nanoscale material structures.

APT can detect features at the atomic scale, often below one nanometer, making it one of the most precise techniques for nanoscale material analysis.

Ultra-high vacuum conditions prevent contamination and ensure accurate detection of ions evaporated from the specimen during analysis.

APT allows scientists to study atomic-scale structures, detect trace elements, and understand nanoscale material behavior, which is essential for developing advanced materials and improving product performance.