Total Reflection X-ray Fluorescence (TXRF)

Total Reflection X-rays Fluorescence (TXRF) utilizes total reflection of incident primary X-Rays, to enhance the intensity of Secondary (Fluorescent) X-rays emitted from a thin sample, placed on a polished carrier. This enables trace and ultra-trace elemental surface analysis of thin sample layers.

Talk to an Expert

Total Reflection X-ray Fluorescence (TXRF)

TRUSTED BY

Precision-driven testing for dimensional accuracy and compliance

Overview
Scope, Applications, and Benefits
Test Process
Specifications
Instrumentation
Results and Deliverables

Overview

Total Reflection X-ray Fluorescence (TXRF) is a highly sensitive analytical technique used for trace elemental analysis of liquids, solids, and thin films. It operates on the principle of total external reflection of X-rays at very low incident angles, minimizing background noise and enabling detection of elements at ultra-trace levels.

TXRF is widely used in environmental analysis, semiconductor manufacturing, pharmaceuticals, and material science for accurate quantification of elemental composition. Its ability to analyze very small sample volumes with minimal preparation makes it an efficient and reliable method for high-precision elemental characterization.

Scope, Applications, and Benefits

Scope

Total Reflection X-ray Fluorescence enables qualitative and quantitative elemental analysis at trace levels using low-angle X-ray excitation and fluorescence detection.

Applicable to liquids, solids, and thin films
Detects trace and ultra-trace elemental concentrations
Supports multi-element analysis simultaneously
Requires minimal sample preparation
Ensures compliance with analytical standards

Applications

Environmental water and soil analysis
Semiconductor contamination analysis
Pharmaceutical elemental testing
Food and beverage analysis
Material purity and trace element detection

Benefits

Extremely high sensitivity for trace elements
Requires very small sample volume
Minimal sample preparation needed
Non-destructive analytical technique
Enables multi-element detection in a single run

Test Process

Sample Preparation

A small amount of sample is deposited onto a sample carrier and dried to form a thin layer.

Instrument Setup

The TXRF instrument is calibrated and aligned for low-angle X-ray incidence.

X-ray Excitation

The sample is irradiated with X-rays under total reflection conditions to generate fluorescence.

Detection & Analysis

Emitted fluorescence is detected and analyzed to determine elemental composition and concentration.

Technical Specifications

Parameter	Details
Detection limit	ppb to ppm levels
Sample volume	Typically a few microliters
Elements detected	Broad range (Na to U)
Measurement type	Qualitative and quantitative analysis
Excitation source	X-ray tube
Angle of incidence	Below critical angle for total reflection
Output	Elemental spectra and concentration values

Instrumentation Used for Testing

TXRF spectrometer
X-ray source (X-ray tube)
Sample carriers (quartz/glass reflectors)
Detector (silicon drift detector)
Data analysis software

Results and Deliverables

Elemental composition and concentration data
Trace element detection results
Spectral analysis graphs
Quantitative analysis report
Compliance and interpretation report

Why Choose Infinita Lab for Total Reflection X-ray Fluorescence?

At the core of this breadth is our network of 2,000+ accredited labs in the USA, offering access to over 10,000 test types. From advanced metrology (SEM, TEM, RBS, XPS) to mechanical, dielectric, environmental, and standardized ASTM/ISO testing, we give clients unmatched flexibility, specialization, and scale. You’re not limited by geography, facility, or methodology—Infinita connects you to the right testing, every time.

Looking for a trusted partner to achieve your research goals? Schedule a meeting with us, send us a request, or call us at (888) 878-3090 to learn more about our services and how we can support you. Request a Quote

Frequently Asked Questions

TXRF is an analytical technique used to detect and quantify trace elements in samples. It uses low-angle X-ray reflection to minimize background noise, allowing highly sensitive and accurate elemental analysis.

TXRF can analyze liquids, solids, and thin films. It is especially useful for samples requiring trace element detection with minimal preparation and very small sample volumes.

TXRF minimizes background interference by using total reflection geometry, which enhances signal detection. This allows accurate measurement of very low concentrations of elements in a sample.

An internal standard is added to the sample to improve accuracy and quantification. It helps correct variations in measurement conditions and ensures reliable concentration results.

Factors include sample preparation, uniformity of the deposited layer, calibration, and instrument settings. Proper handling ensures accurate and reproducible elemental analysis results.