(888) 878-3090
Total Reflection X-rays Fluorescence (TXRF) utilizes total reflection of incident primary X-Rays, to enhance the intensity of Secondary (Fluorescent) X-rays emitted from a thin sample, placed on a polished carrier. This enables trace and ultra-trace elemental surface analysis of thin sample layers.
Total Reflection X-rays Fluorescence (TXRF) utilizes total reflection of a known wavelength of primary X-Rays, to reduce background scatter and noise in the secondary emission (Fluorescence) from a targeted sample surface. This technique increases the intensity of the desired spectrum of Secondary X-Rays emitted by analyte atoms on the surface of a thin sample (~ 100 microns). In this technique, a small quantity of the sample is deposited as a thin layer on a polished sample carrier. An incident primary X-Ray beam impinges upon the sample carrier at an angle below the critical angle of Total Reflection for X-rays.
The critical angle depends upon the polished carrier material and the incident X-Ray wavelength. Typical Critical angles range from 0.040 for Plexiglass at 35keV to 0.550 for Gold at 8.4 keV. The atoms in the sample, when excited by impinging primary X-rays, emit secondary X-rays (Fluorescence), which are counted and measured by a solid-state detector. The detector is placed directly above the sample at a distance of about 0.5 mm to 1 mm, to capture maximum Fluorescence radiation from the sample. The measured signal is analyzed by energy intensity, providing an energy dispersive spectrum. While measurements can be done in air, the TXRF can be performed in special chambers under vacuum or in the Helium atmosphere.
Common Uses of Total Reflection X-ray Fluorescence (TXRF)
Advantages of Total Reflection X-ray Fluorescence (TXRF)
Limitations of Total Reflection X-ray Fluorescence (TXRF)
Industrial Applications of Total Reflection X-ray Fluorescence (TXRF)
hello@infinitalab.com
Enter Sample and testing requirementsProvide your contact information
Attach file
Δ
EELS analysis of gate and channel is performed on fin field-effect transistors (finFETs). Scanning transmission electron…
FTIR analysis is used to study the migration and leaching of phthalate plasticizers from p-PVCs. Phthalate…
Nano-scale surface roughness is a critical parameter in fabricated thin-films that are used in optics, solar…
Start Testing
ASTM E572 test method covers the analysis of stainless and alloy steels by Wavelength Dispersive X-ray Fluorescence Spectrometry (WDXRF). It provides rapid, multi-element determinations with sufficient accuracy to assure product quality.
The ASTM D2674 test is a standard test method for the analysis of sulfochromate etch solutions used in the surface preparation of aluminum. The ASTM D2674 standard specifies a method for determining the efficacy of an etchant used to prepare the surface of aluminum alloys for subsequent adhesive bonding.
An immunological method for quantization of Hevea Natural Rubber (HNRL) proteins using rabbit anti-HNRL serum. Rabbits immunized with HNRL proteins react to the majority of the proteins present, and their sera have the capability to detect most if not all the proteins in HNRL.
ASTM G65 measures the resistance of metallic materials to abrasion using the dry sand/rubber wheel apparatus. The quality, durability, and toughness of the sample are determined using this test. Metallic materials are ranked in their resistance to scratching abrasion under a controlled environment.
ASTM E2141 test methods provide accelerated aging and monitoring of the performance of time-dependent electrochromic devices (ECD) integrated in insulating glass units (IGU). This test helps to understand the relative serviceability of electrochromic glazings applied on ECD.
ASTM C724 test method is used in analyzing the quality and ease of maintenance of a ceramic decoration on architectural-type glass. This test method is useful in the acknowledgment of technical standards.
You share material and testing requirements with us
You ship your sample to us or arrange for us to pick it up.
We deliver the test report to your email.
Let’s work together!
Share your testing requirements with us and we will be happy to assist you.
What Material or product do you have?
What analysis do you need?
How many parts or coupons do you have?
How fast do you need the results back?
Do you know the goal of the analysis you need?
Contact Information
Name
E-mail
Contact number
Query
Submit