PIXE is a non-destructive, elemental analysis technique widely used for trace element and multi-element analysis.
Average 30% Cost
Savings
100% Confidentiality
Guarantee
Free, No-obligation
Consultation
100% Customer
Satisfaction
PIXE is a non-destructive, elemental analysis technique widely used for trace element and multi-element analysis. When charged particles collide with target atoms of a specimen, X-rays characteristic of the elements present in the sample are emitted and detected by the high-resolution silicon detector. PIXE has a high sensitivity for elements from Sodium to Uranium (ppb~ppm). It is used to analyze a diverse range of specimens, including air filters, semiconductor wafers, archeological artifacts, crystalline, and liquid proteins, thin films, coatings, food, biological samples, etc.
Ion beam sources in PIXE can be configured for specific applications. Scanning ion beams are used to obtain a 2D elemental distribution, and micro ion beams are used for the focused micron-scale analysis of samples. PIXE is also a complementary technique to RBS (Rutherford Backscattering Spectroscopy) and is widely used together for heavy element identification in materials.
Infinita Lab provides Particle Induced X Ray Emission – PIXE Laboratory Services in California, USA. Check more testing services at infinitalab.com.
Secondary Ion Mass Spectroscopy – SIMS
Secondary Ion Mass Spectrometry - SIMS Testing Services Secondary Ion Mass Spectroscopy (SIMS) is a tool for the composition analysis of metals, semiconductors, polymers, biomaterials, minerals, rocks, and ceramics. As... 
Optical Profilometry
Optical Profilometry Testing Optical Profilometry (OP) or White Light Interferometry (WLI) is an interferometric-based non-contact technology for the measurement of surface topography. It is used to measure surface roughness, coating... 
X-Ray Fluorescence Spectroscopy – XRF
X-Ray Fluorescence Spectroscopy Testing Facility XRF is an elemental and chemical analysis tool. Handheld XRF is particularly useful for inspection and quick nondestructive analysis of large objects such as automotive... 
Our network of testing labs regularly provides particle induced X-ray emission (PIXE) material analysis services.
particle induced X-ray emission (PIXE) is a great tool for simultaneous elemental analysis of solid, liquid, or thin-film samples. It is a preferred method for its minimal to no sample prep required and fast testing times. PIXE systems have also been employed in QA/QC programs with proper instrument calibrations in place.
Particle induced X-ray emission (PIXE) can detect elements from Sodium through Uranium in solid, liquid, and aerosol filter samples.
ASTM E572 test method covers the analysis of stainless and alloy steels by Wavelength Dispersive X-ray Fluorescence Spectrometry (WDXRF). It provides rapid, multi-element determinations with sufficient accuracy to assure product quality.
The ASTM D2674 test is a standard test method for the analysis of sulfochromate etch solutions used in the surface preparation of aluminum. The ASTM D2674 standard specifies a method for determining the efficacy of an etchant used to prepare the surface of aluminum alloys for subsequent adhesive bonding.
An immunological method for quantization of Hevea Natural Rubber (HNRL) proteins using rabbit anti-HNRL serum. Rabbits immunized with HNRL proteins react to the majority of the proteins present, and their sera have the capability to detect most if not all the proteins in HNRL.
You share material and testing requirements with us
You ship your sample to us or arrange for us to pick it up.
We deliver the test report to your email.
Just share your testing requirements and leave the rest on us!
