X-ray Fluorescence Spectrometry (XRF)

  
Vinod Kumar
Published :




  

 X-ray Fluorescence Spectrometry (XRF)

An energy dispersive x-ray fluorescence (EDXRF) spectrometer is the XRF device used at Infinita Labs. Nearly every element in the periodic table, from sodium (Na) to uranium (U), can be measured using the EDXRF in concentrations ranging from ppm levels to about 100% by weight. It can be applied to the addition of small additives as well as the monitoring of significant components in a process or product.

The EDXRF’s minimal sample preparation requirements and ability to perform quick, real-time multi-element analyses on a variety of samples, including solids, liquids, powders, thin films, slurries, and pastes, are two of its most crucial features. These benefits approach appealing to a wide range of sectors.

Additionally, the EDXRF at Infinita Labs can carry out high-precision analysis on a 0.1 mm or 1.2 mm in diameter area. It is compatible with a wide range of sample sizes, from small parts to massive goods, thanks to the combination of its large sample chamber and small X-ray beam diameter. Without sample preparation, the elemental content of products and parts can be measured.

Variety of X-ray services with pride:

  • Services for Automatic X-ray Inspection
  • Services for 2D and 3D X-ray Inspection
  • Services for digital radiography (DR)
  • Services for Industrial CT Scanning
  • Services for High-Energy X-Ray Inspection

Video 01:X-ray inspection system “All in one”

Applications for these services are numerous and diversifying daily. Although the Latest X-ray systems and services have their roots in electronics in general and printed circuit boards in particular, they are now used for a variety of applications including metrology, mechanical engineering, counterfeit screening, additive 3D printing and manufacturing, injection moulding, casting, materials science, biotechnology, medical, and aerospace. Every year, there are more applications on the list. Every week, we take on a wider range of projects. We welcome what we affectionately refer to as “scientific projects,” which are merely new applications to our group. We encourage potential clients with similar projects to get in touch with us, explain their difficulties, and bring us a sample part for inspection. We will give you our time in return if you give it to us. If your application can be successfully addressed, we’ll come up with a mutually agreeable inspection schedule. If we are unsuccessful, we will shake hands, not bill you for the effort, and hope to work with you more successfully in the future.

Every solder joint on a printed circuit board is captured in 3D laminographic images using Automatic X-ray Inspection, or AXI, from both the top and bottom sides. A program that examines newly manufactured failed, and “bone pile” boards against preloaded algorithms that inspect solder joints by IPC-A-610 requirements is based on ODB++ or Ascii-formatted CAD files. Failures are located, and photographs of flaws are taken and recorded. Suitable for manufacturing in low- to high-volume.

Top-down and oblique angle views of geometric objects are used in 2D and 3D X-ray inspection services to spot known flaws or confirm specific traits, qualities, or screen irregularities in materials. The emphasis is on quickly validating suspicions with results. Most tasks can be finished within 1-3 working days. This is significant since our main client is a process or quality engineer who has an urgent problem that needs to be fixed. Reports can come after, but getting a visual of the issue is crucial so that quick corrective action can be performed.

Services for digital radiography (DR) Services for nondestructive testing (NDT) for materials analysis, process validation, and defect detection.

Industrial CT scanning services 3D tomographic imaging and analysis for metrology applications, materials analysis, and process validation as well as nondestructive testing (NDT) of difficult-to-identify flaws. Class II and Class III technicians that have received NAS 410 certification are available for projects.


Leave a Reply

Need help or have a question?
Case Study In-depth examination of genuine material testing solutions
Dopant and ultra-low concentration elemental analysis using Scanning…

EELS analysis of gate and channel is performed on fin field-effect transistors (finFETs). Scanning transmission electron…

Learn More
Analysis of degradation of PVC pipe using Fourier…

FTIR analysis is used to study the migration and leaching of phthalate plasticizers from p-PVCs. Phthalate…

Learn More
Nano-scale roughness measurement of Si-wafers by Atomic Force…

Nano-scale surface roughness is a critical parameter in fabricated thin-films that are used in optics, solar…

Learn More
See all Case Study

Looking for Material Testing?

We have already delivered 20,000+ Material Test results to top companies

    Free Consultation? - Talk to our experts

    (888) 878-3090

    Discover more from Infinita Lab

    Subscribe now to keep reading and get access to the full archive.

    Continue reading

    Ensure Quality with the Widest Network of Accredited Labs
    • ddd
      Quick Turnaround and Hasslefree process
    • ddd
      Confidentiality Guarantee
    • ddd
      Free, No-obligation Consultation
    • ddd
      100% Customer Satisfaction

      ddd

      Start Material Testing