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JESD 22-A104B
JESD 22-A104B is a test standard that specifies the procedure for testing electronic components for their resistance to high temperature and high humidity conditions. This test is designed to evaluate the long-term reliability of electronic components, as exposure to high temperature and high humidity conditions can cause a variety of failures, including corrosion, oxidation, and electrical shorts.
The JESD 22-A104B test involves subjecting electronic components to a temperature of 85°C and a relative humidity of 85% for 1000 hours. During this time, the components are monitored for any signs of failure, including changes in electrical properties, physical damage, or other issues. The test is intended to simulate the harsh conditions that electronic components may encounter during their lifetime, including exposure to high temperatures and humidity in industrial or outdoor environments.
The purpose of the JESD 22-A104B test is to provide a standardized method for evaluating the reliability of electronic components under high temperature and high humidity conditions. By subjecting components to this test, manufacturers can determine how well their products will perform in harsh environments and make any necessary design changes to improve their reliability.
JESD 22-A104B is a widely recognized and respected test standard in the electronic industry. By adhering to this standard, manufacturers can ensure that their products meet a high level of reliability and performance, and can demonstrate this to their customers and partners.
JESD22-A104B is an important test method for evaluating the reliability of integrated circuits and other semiconductor devices under temperature cycling conditions. By subjecting devices to repeated temperature cycling, any weaknesses or defects in the device’s construction or materials can be identified, and the device’s overall reliability can be evaluated.
Video 01: High-Temperature Reliability
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