Semiconductor Testing Services

Advanced Semiconductor Testing Services | Precision & Innovation

Introduction to Semiconductor Testing Services

Testing of semiconductors is of utmost importance in the fast-evolving electronics sector, in which reliability, performance, and precision build the foundation of a successful operation. Semiconductors, whether sensors and microprocessors or power devices and integrated circuits, make up the pillars of present-day technologies. To ascertain their performance, durability, and reliability, specifically crafted tests by world standards must be conducted.

At Infinita Lab, our Semiconductor Test Services aim to meet the intricate needs of such a highly precise sector. Utilizing the latest analytical methods and cutting-edge instruments, we also offer complete test solutions that ensure the electric, heat, mechanical, and environmental performance of semiconductor components and materials.

Importance of Semiconductor Testing

The semiconductor test is most critical in maintaining electronics that power modern life in terms of their integrity, safety, and performance. Since the design complexity of semiconductors continues to increase, the most minuscule fault or drift in performance is capable of bringing about enormous quantities of faulty units.

The intense testing ensures that the SEM products shall meet their design specification, shall operate safely in various environmental conditions. It enables manufacturers to:

• Discover and correct defects during the early production process
• Enhance device reliability and performance
• Minimize unjustified product recall and field failure expenses
• Verify compatibility for end-use applications
• Support innovation with data-driven material and process optimization

By ensuring each of the key parameters, from electric properties to heat stability, a semiconductor test ensures product reliability and maintains confidence in the electronics supply chain.

Key Semiconductor Testing Capabilities

Electrical Characterization

The electric characterisation tests we conduct take key semiconductor characteristics, including current-voltage (I-V) and capacitance-voltage (C-V) profiling. To ensure device operating performance, behaviour, and function, with diverse operating conditions for best process and design control, these tests assist in verifying that products meet specifications.

Temperature Coefficient of Resistance (TCR) Testing

The TCR test assesses the variation in the semiconductor material’s resistance as temperature changes. It is also a key test for products where stable electric performance is required within a range of temperatures, as it enables product reliability in rigorous environments.

Environmental Testing

For long-term reliability and life, we also subject parts to rigorous environmental tests such as Humidity Resistance Testing and Temperature Cycling. These simulations of harsh environmental conditions assess the competence of the semiconductor to survive mechanical stress as well as heat stress while in service.

Carrier Lifetime Testing

Carrier lifetime measurement identifies how long charge carriers, holes, and electrons are useful in the semiconductor material. Data is the key to maximizing the efficiency and operating speeds of components, including parts such as photovoltaic cells, transistors, and diodes.

Dielectric Strength Testing

Dielectric strength tests verify the insulating capability of a semiconductor when it is subjected to high stress voltages. By verifying the capability of the material to prevent electrical breakdown, the test ensures safety and reliability, especially in power semiconductor devices.

Thermal Characterization

Effective spreading of heat is critical in semiconductor operation. Thermal characterizations of our lab include the measurement of heat conductivity, junction temperature, and thermal impedance—the parameters significant in preventing device overheating and device stability and life.

Surface Analysis

The semiconductor properties highly correlate with surface properties. As per the most recent analytical techniques, i.e., Atomic Force Microscopy (AFM), X-ray Photoelectron Spectroscopy (XPS), etc., we examine the surface morphology, composition, and defect characteristics that influence electric as well as optical properties.

Electrostatic Discharge (ESD) and Electrical Overstress (EOS) Testing

The tests conducted here by our service for ESD and EOS determine the tolerance of a semiconductor for instantaneous surges of voltage or electrostatic discharge. These tests prevent device failure while in use for handling, assembling, or in actual applications.

Why Choose Infinita Lab for Semiconductor Testing Services?

With Infinita Lab (www.infinitalab.com), you are guaranteed a Nationwide Network of Accredited Laboratories spread across the USA, the best Consultants from around the world, Convenient Sample Pick-Up and Delivery, and Fast Turnaround Time. 

Our team understands the stakes and subtleties of every test. Whether you’re validating a new Product, de-risking a prototype, or navigating complex compliance requirements, our specialists guide the process with rigor and clarity.  

Looking for a trusted partner to achieve your research goals? Schedule a meeting with us, send us a request, or call us at (888) 878-3090  to learn more about our services and how we can support you. Request a Quote