Armor Losses in High Voltage Cables in Metrology

Written by Rahul Verma | Updated: September 18, 2025

Armor Losses

Armor is used in high voltage cables to prevent the cable from being damaged by impact or abrasion and to act as a grounding path. Yet, armor can also contribute to cable losses because alternating current (AC) passing through the cable induces eddy currents in the armor. Armor losses are one reason why cables may not be as effective as they may be.

Armor losses in high voltage cables vary in intensity depending on a number of variables, such as the armor’s material and thickness, the strength and frequency of the AC, and the distance between the armor and the cable’s conductor. Many methods exist for determining armor losses in high voltage cables.

The inductive approach includes wrapping a coil around the armor and measuring the voltage induced in the coil as a result of the eddy currents. The magnitude of the induced voltage, which may be measured with a voltmeter or oscilloscope, is inversely proportional to the armor loss.

To prevent interference from the electromagnetic fields caused by the eddy currents, a shield can be wrapped around the cable as part of the shielding approach. Using a clamp-on ammeter, the amount of the shielded current is measured, and the armor losses are determined by subtracting the shielded and unshielded currents.

The current and voltage in the cable are measured as the AC frequency is swept across a range of values; this is the frequency sweep method. Armor losses are found by subtracting the observed current from the theoretical current.

The heat dissipation method involves taking readings from thermocouples or infrared cameras to determine the armor’s internal temperature. It is possible to compute the heat created by the eddy currents using the measured temperature and the thermal conductivity of the armor material.

Testing and maintaining high voltage cables includes taking measurements of armor losses to guarantee the cable will function effectively and reliably for its intended lifespan.


Case Studies

In-depth examination of genuine material testing solutions

Dopant and ultra-low concentration elemental analysis using Scanning…

banner

Dopant and ultra-low concentration elemental analysis using Scanning…

EELS analysis of gate and channel is performed on fin field-effect transistors (finFETs). Scanning transmission electron...

Read Case Study

Analysis of degradation of PVC pipe using Fourier…

Fourier Transform Infrared Spectroscopy (FTIR)

Analysis of degradation of PVC pipe using Fourier…

Introduction PVC is the polymer primarily used to make pipes for plumbing, drainage, and electrical conduits....

Read Case Study

Nano-scale roughness measurement of Si-wafers by Atomic Force…

banner

Nano-scale roughness measurement of Si-wafers by Atomic Force…

Nano-scale surface roughness is a critical parameter in fabricated thin-films that are used in optics, solar...

Read Case Study

Talk to Our Experts Today!

Submit your contact info and we’ll get back to you within 24 hours

    Discover more from Infinita Lab

    Subscribe now to keep reading and get access to the full archive.

    Continue reading

    ×

    Talk to an Expert

      Connect Instantly

      (888) 878-3090
      Ensure Quality with the Widest Network of Accredited Labs
      • ddd
        Quick Turnaround and Hasslefree process
      • ddd
        Confidentiality Guarantee
      • ddd
        Free, No-obligation Consultation
      • ddd
        100% Customer Satisfaction

        ddd

        Start Material Testing