ASTM F76 Test Methods for Measuring Resistivity and Hall Coefficient and Hall Mobility in Single-Crystal Semiconductors

Introduction

The ASTM F76 standard test has two ways to check single-crystal semiconductor samples’ resistivity and Hall coefficient. The main difference is the test sample requirements. The values are in standard metric units.

Scope

The ASTM F76 standard test helps determine the quality of materials for making semiconductor devices. It measures how well electricity moves through the material. Furthermore, this tells which material works best. The test can also show other details about the material, like how many charged particles are in it and how fast they move. These details help describe the material’s specifications.

Procedure

Test Method A:

A singly connected test sample with even thickness and any shape is needed. The sample should not have isolated holes. The contacts must be small and on the edge of the sample. Interpretation is straightforward for an isotropic semiconductor with one type of leading carrier. This test needs a singly connected sample with even thickness but any shape. There must not be isolated holes in the sample. The contacts should be small and on the edge of the sample. Moreover, the measurement is most straightforward for an isotropic semiconductor with one primary type of carrier.

Test Method B:

It’s called the parallelopiped or bridge type. Moreover, it needs a specimen with the same thickness and a particular shape. There are rules about the contact for both the parallelopiped and bridge shapes. These test specimen shapes are suitable for anisotropic semiconductors because the measured values depend on the direction of the current flow. This test method is also easiest to understand when one type of carrier controls the conduction.

However, these methods do not offer the process required for shaping, cleaning, or contacting specimens. It provides a procedure for verifying contact quality.

Specimen Size

For ASTM F76, the thickness must be consistent. It should be within 1% of the total thickness and not be more than 0.10 cm. The specimen’s entire length should be between 1.0 and 1.5 cm.

Data

ρ = 1/eμn

RH = r/nq

μH = rμ

where ρ is resistivity, μH is Hall mobility, and RH is Hall coefficient.

Result

The ASTM F76 test method evaluates resistivity, Hall coefficient, and Hall mobility in single-crystal semiconductors, specifying procedures for isotropic and anisotropic materials. Moreover, it provides accurate results that help ensure the appropriate selection and development of semiconductor materials for specific high-performance applications.

Applications

ASTM F76 describes the resistivity, Hall coefficient, and Hall mobility of single-crystal semiconductors. It finds the following critical applications:

1. Material selection: The suitable semiconductor material with desired electrical properties can be selected according to suitable electrical properties used in transistors, diodes, and integrated circuits.
2. Optimization of material properties: Material properties may be optimized to enhance efficiency and performance within semiconductor devices.
3. Consistency Checks: Helps ensure semiconductor materials come out of production with the desired electrical standards and quality entering assembly.
4. Process Monitoring of Manufacturing: This helps monitor manufacturing processes and enables their improvement by ensuring material properties—thus, more importantly, ensuring consistency and reliability in semiconductor production lines.
5. Material Characterization: Provides definitive data for fundamental research on new semiconductor materials, advanced materials, and compounds regarding their electrical properties.
6. Innovation: It aids in developing new semiconductor technologies by providing information on the behavior and performance of materials under different conditions.
7. Design Requirements: Provides essential information for electronic component design with specific electrical characteristics to ensure such components behave correctly in an electronic system.
8. Simulation and Modeling: Provides the accurate electrical property information needed in simulation and modeling work to predict the performance of a particular component.

Conclusion

The ASTM F76 is a standard procedure. It determines resistivity, Hall coefficient, and Hall mobility in single-crystal semiconductors. The standard has two test methods. Method A is for isotropic materials. Method B is for anisotropic materials. This method can find material characteristics. It helps assess suitability for semiconductor devices. It can also estimate charge carrier density and other factors. The standard does not address shaping or contacting a specimen. However, it ensures accurate measurement and interpretation of critical semiconductor properties. This specification is vital for developing high-performance electronic components.

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