Solar Radiation Testing

Solar radiation testing involves understanding sunlight’s thermal and photochemical degradation effects on materials and components. This testing helps make decisions regarding material selection, manufacturing, and intended use of finished products. UV exposure can significantly damage non-metallic materials, changes in strength and elasticity, changes in electrical and electronic components, pressure changes, discoloration, sweating of composite materials, peeling, delamination, etc. Effective testing and characterization of materials can help engineers design better products to sustain these effects and perform efficiently. The most frequently performed radiation standard testing is the MIL-STD 810, which broadly specifies the testing methodologies to test the effects of heat and degradation due to light exposure. Cyclic and steady-state tests simulate months or even years of bright light, heat, UV, infrared radiation, and indoor artificial light exposure using large environmental chambers, solar arrays, etc. Combined ecological testing is also performed to evaluate the effect of solar radiation under temperature variations and humidity.

Solar Radiation Testing

  • MIL STD 810 Method 505; Cyclic (Part 1), Steady-state (Part 2)
  • VDA 230-219
  • MBN 55555-5
  • DIN 75220

Common Uses

  • Evaluate fading in coatings and plastics
  • Study oxidation, embrittlement, cracking, chalking in plastics and vinyl
  • Study structural damage in plastics, vinyl, and metals
  • Delamination effects in coatings, polymers, and vinyl
  • Study ductility and other mechanical issues in plastics and vinyl
  • Assess embrittlement for plastics and coatings
  • Evaluate the performance of products for warranty issuance
  • Indoor UV light exposure studies

Industries

  • Aerospace
  • Automotive
  • Defense
  • Paints and Coatings
  • Rubber and Elastomers
  • Laminates and Vinyl
  • Consumer Goods
  • Polymers




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Case Studies

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Analysis of PVC Pipe Degradation Using FTIR Spectroscopy

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Nano-scale roughness measurement of Si-wafers by Atomic Force…

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