Atomic Force Microscopy – AFM

Atomic Force Microscopy (AFM) is a non-optical surface topographic analysis technique with high lateral (nm), vertical (Aº), and force (pN) resolution. AFM is used to obtain high-resolution nanoscale images and study local sites of micro/nanostructured coatings and surfaces.

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Overview
Scope, Applications, and Benefits
Test Process
Specifications
Instrumentation
Results and Deliverables

Overview

Atomic Force Microscopy (AFM) is an accurate method to observe the way something looks on the nanometer scale in terms of its form, texture, and other tiny features. It does this by scanning the surface of the object with a pointed probe attached to a spring-like structure called a cantilever. The interaction between the probe and the object causes the cantilever to change its position, which is then detected by a laser to produce an image.

The result is an image of the object in three dimensions, with nanometer or even atomic resolution. AFM is used in fields like nanotechnology, materials science, semiconductor research, polymers, and biology, where surface properties and microstructures are important.

Scope, Applications, and Benefits

Scope

Atomic Force Microscopy (AFM) is an advanced surface analysis technique that allows for the observation of surface features at the nanoscale for various materials. The technique involves sliding a sharp tip on the surface of the material and is capable of producing rich 3D images that show the interaction of the surface at nanometre distances. The technique has gained prominence in various fields, including materials science, nanotechnology, semiconductor studies, and biology.

AFM is capable of analysing:

– Polymers
– Thin films and coatings
– Semiconductor materials
– Nanomaterials and nanoparticles
– Metals and alloys
– Ceramics and composites

Applications

Surface morphology analysis
Nanostructure characterization
Thin film thickness evaluation
Polymer surface studies
Semiconductor wafer inspection
Nanotechnology research
Coating and surface engineering analysis
Failure analysis and defect detection

Benefits

Extremely high spatial resolution
Three-dimensional surface imaging
Minimal sample preparation required
Non-destructive analysis capability
Applicable to conductive and non-conductive materials
Quantitative measurement of nanoscale features
Multiple imaging modes for different properties

Test Process

Sample Preparation

The sample is cleaned and mounted on the AFM stage.

Probe Interaction

A sharp probe interacts with the surface at the nanoscale.

Surface Scanning

The probe scans the surface in a raster pattern to detect features.

Detection & Imaging

Cantilever deflections are measured to generate a 3D surface image.

Technical Specifications

Parameter	Details
Resolution	Nanometre to atomic-level resolution
Imaging Modes	Contact mode, tapping mode, non-contact mode
Measured Parameters	Surface roughness, height profile, grain size, adhesion, friction
Applicable Materials	Polymers, metals, ceramics, semiconductors, nanomaterials
Output Format	3D surface topography maps and quantitative surface parameters

Instrumentation Used for Testing

Atomic force microscope system
Cantilever probes with nanoscale tips
Laser detection system
Photodiode detector
Piezoelectric scanner
Vibration isolation stage
Computer with AFM control and analysis software

Results and Deliverables

High-resolution 3D surface images
Surface roughness measurements
Grain size and nanoscale feature analysis
Topography and height profile maps
Adhesion and friction measurements
Comparative surface analysis reports

Partnering with Infinita Lab for Optimal Results

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Looking for a trusted partner to achieve your research goals? Schedule a meeting with us, send us a request, or call us at (888) 878-3090 to learn more about our services and how we can support you. Request a Quote

Frequently Asked Questions

AFM can analyze a wide variety of materials including polymers, metals, ceramics, semiconductors, thin films, coatings, nanomaterials, and biological samples such as cells and proteins.

AFM provides detailed information about surface topography, roughness, grain size, nanoscale features, and mechanical properties such as adhesion and friction at the nanoscale.

The most common AFM imaging modes include contact mode, tapping mode (intermittent contact), and non-contact mode. Each mode is suitable for different types of samples and surface characteristics.

No. AFM typically requires minimal sample preparation. The sample surface only needs to be clean and securely mounted on the instrument stage.

AFM offers extremely high spatial resolution, typically in the nanometre range and sometimes even at atomic-level resolution depending on the sample and instrument configuration.