Automated Curve Tracers: I-V Characterization of Semiconductor Devices

Written by Dr. Bhargav Raval | Updated: June 17, 2026

Automated Curve Tracers: I-V Characterization of Semiconductor Devices

Written by Dr. Bhargav Raval |  Updated: June 17, 2026

Automated Curve Tracers

Automated curve tracers are electronic test tools that closely resemble oscilloscopes. They work by changing one parameter and then measuring a different one to create data for analysis that relates to the properties of semiconductor devices like diodes, transistors, and thyristors. Time sampling, list sweep, and multichannel sweep functionality are available in curve tracers. They help in semiconductor device curve characterisation and semiconductor failure analysis.

Curve tracer devices use voltage and current sources to stimulate the test device.  The components show X-Y output signals on a scope by using voltage sweeps. The scope displays graphics that represent the normal behaviour of a certain work area that belongs to the device under test with one or more curves.

Curve tracers can be divided into three categories:

  • Current-voltage pulses (fast IV)
  • Current-voltage (IV) 
  • Capacitance-voltage (CV) 

ABOUT AUTHOR

Professionally, he has led R&D in sensor technologies and coatings, including polymer-functionalized piezoelectric sensors for breath-based cancer diagnostics. In his current role, Dr. Raval works closely with clients to understand technical requirements, design testing strategies, and deliver tailored solutions in materials selection, failure analysis, and performance evaluation.... Read More

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