Laser-Induced Breakdown Spectroscopy (LIBS)

Laser-induced breakdown spectroscopy (LIBS) uses a highly energetic laser pulse as an excitation source to ablate material from sample surfaces, vaporize them to plasma and then identify elements based on characteristic spectral emissions. This enables identification and removal of trace contaminants. In this case study, the LIBS technique was used for detection of low levels of silicone contaminants in CFRP composites.

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    Laser-Induced Breakdown Spectroscopy (LIBS)

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    • Overview
    • Scope, Applications, and Benefits
    • Test Process
    • Specifications
    • Instrumentation
    • Results and Deliverables

    Cyclic Moisture Resistance Testing Overview

    Laser-Induced Breakdown Spectroscopy (LIBS) is a rapid, near-non-destructive elemental analysis technique that uses a highly focused, pulsed laser to ablate a tiny amount of material from a sample surface and vaporize it into a plasma. As the plasma cools, the excited atoms and ions emit light at wavelengths characteristic of each element – the same physical principle that gives each element its unique spectral signature. A spectrometer collects and resolves this emission, identifying which elements are present from the emission wavelengths and quantifying them from the emission intensities.

    The ablation spot produced by LIBS is extremely small – typically less than a millimeter in diameter and only a few microns deep – making the technique essentially non-destructive for most materials. A full elemental spectrum is acquired in milliseconds, and because the laser can be pointed at any accessible surface, LIBS is well suited to in-situ analysis, mapping, and rapid screening without sample preparation. The technique covers most of the periodic table simultaneously, including light elements such as lithium, beryllium, carbon, and sodium that are difficult to detect by XRF.

    LIBS is used for rapid alloy identification and positive material identification (PMI), for contaminant and trace element detection, for elemental mapping across a material surface, and for the analysis of samples that cannot easily be dissolved or prepared for other techniques. It sits alongside XRF and OES as a practical field and laboratory tool for elemental analysis of solids, with advantages in speed, minimal sample preparation, and light-element sensitivity.

    Cyclic Moisture Resistance Testing Scope, Applications, and Benefits

    Scope

    LIBS covers the rapid, near-non-destructive elemental analysis of solid, powder, and liquid samples through laser ablation and optical emission spectroscopy of the resulting plasma, detecting and quantifying most elements simultaneously.

    Key aspects of the technique include:

    • Elemental coverage – simultaneous detection of most elements across the periodic table, including light elements (Li, Be, B, C, N, Na, Mg, Al, Si) that XRF cannot detect well
    • Near-non-destructive – the ablation spot is submillimeter and a few microns deep, leaving the sample essentially intact for further analysis or return to service
    • No sample preparation – most solid samples are analyzed directly; no dissolution, polishing, or coating is required
    • Speed – a complete elemental spectrum is acquired in milliseconds; alloy identification and screening are completed in seconds
    • Spatial analysis and mapping – the focused laser can be rastered across a surface to produce elemental maps showing where each element is concentrated
    • In-situ and field capability – portable LIBS instruments enable in-situ analysis of components, surfaces, and structures without removing samples to a laboratory
    • Quantitative analysis – with calibration against matrix-matched standards, quantitative elemental concentrations can be determined

    Applications

    • Alloy identification and PMI (Positive Material Identification) – rapid identification of metal alloys (stainless steel grades, nickel alloys, aluminum alloys, titanium alloys) on-site or in the laboratory, verifying that components are the correct material
    • Scrap metal sorting – rapid elemental analysis to sort and separate alloy grades in recycling and scrap-metal processing
    • Contaminant and trace element detection – detecting trace elemental contaminants on surfaces or within materials, such as silicone contamination on composite surfaces, metallic contamination in powders, or process residues
    • Surface contamination mapping – scanning a surface to map the spatial distribution of contaminant elements, identifying where contamination is concentrated
    • Geological and mineral analysis – rapid elemental screening of rock, mineral, and ore samples for exploration and process control
    • Archaeological and cultural heritage analysis – non-destructive elemental analysis of artifacts, pigments, and materials that cannot be sampled destructively
    • Battery materials – analysis of lithium and other light elements in battery cathode, anode, and electrolyte materials
    • Pharmaceutical and food analysis – elemental screening for trace metals and contaminants in solid pharmaceutical and food samples

    Benefits

    • Simultaneous multi-element from a single laser shot – the plasma emission contains the entire elemental spectrum, so all elements are detected together from one measurement rather than sequentially
    • Near-non-destructive with no sample preparation – analysis directly on the solid surface, leaving it essentially intact, avoids the dissolution and preparation steps required by solution-based methods
    • Covers light elements XRF cannot – LIBS detects Li, Be, C, N, Na, and other light elements that X-ray fluorescence cannot measure, making it a useful complement to XRF
    • Fast enough for screening and sorting – millisecond acquisition and second-level identification make LIBS practical for rapid alloy sorting, PMI, and contamination screening at throughputs that other techniques cannot match
    • Enables spatial mapping – rastering the laser across a surface builds an elemental map, revealing heterogeneity, contamination distribution, and compositional gradients that a point measurement misses
    • Field deployable – portable LIBS instruments bring the analysis to the component, not the component to the lab, enabling PMI and screening in process plants, warehouses, and field locations

    Cyclic Moisture Resistance Testing Process

    Prepare the Sample

    Position the sample, clean the test surface, and define the analysis points and number of laser shots.

    1

    Generate the Plasma

    Fire laser pulses to ablate a small amount of material and create plasma.

    2

    Collect the Spectrum

    Record the plasma emission spectrum and average multiple shots for improved accuracy.

    3

    Analyse and Report

    Identify and quantify elements using spectral libraries and calibration data, then report the results.

    4

    Cyclic Moisture Resistance Testing Technical Specifications

    ParameterDetails
    PrincipleLaser ablation → plasma → optical emission spectroscopy
    Elemental CoverageMost elements simultaneously, including light elements (Li, C, Na, Mg, Al, Si, etc.)
    Ablation SpotSub-mm diameter, few microns deep (near-non-destructive)
    Analysis SpeedMilliseconds per spectrum; seconds per identification
    Sample PreparationNone for most solid samples
    Sample TypesMetals, alloys, ceramics, polymers, minerals, powders, liquids
    Spatial AnalysisSurface mapping by rastering the laser
    Field CapabilityPortable instruments available for in-situ analysis

    Instrumentation Used for Cyclic Moisture Resistance Testing

    • Pulsed laser (Nd:YAG or similar)
    • High-resolution spectrometer / spectrograph
    • ICCD (intensified CCD) or time-gated detector for plasma emission collection
    • Sample stage with position control (for mapping)
    • Elemental spectral libraries and data analysis software
    • Portable LIBS instrument (for in-situ/field applications)

    Cyclic Moisture Resistance Testing Results and Deliverables

    • LIBS analysis report – identified elements, their relative intensities or quantitative concentrations, and the analysis conditions
    • Emission spectrum – the recorded optical emission spectrum with identified element lines annotated
    • Alloy identification – the identified alloy grade or the closest match to the measured elemental profile
    • Elemental map (where performed) – spatial maps of elemental distribution across the analyzed area
    • Quantitative results (where calibration applied) – elemental concentrations with the calibration basis documented
    • Contaminant findings – detection and location of contaminant elements where that was the objective
    • Sample records – sample description, analysis location, laser parameters, and number of shots

    Frequently Asked Questions

    Repeated wet and dry conditions can cause corrosion, swelling, cracking, delamination and electrical failures. Testing helps verify durability in humid, tropical or seasonally changing environments.

    Specimens are placed in an environmental chamber and exposed to programmed periods of high humidity, condensation, drying and temperature changes. The cycle is repeated for a specified duration.

    Testing may reveal rust, blistering, peeling, swelling, staining, cracking and adhesive failure. Electronics may also experience leakage current, corrosion, insulation loss or functional instability.

    Exposure may last from several days to several weeks, depending on the standard and required number of cycles. Longer testing may be used for product qualification or comparative durability studies.

    Temperature, relative humidity, condensation rate, cycle duration and specimen orientation can influence performance. Surface preparation, coating thickness and chamber uniformity must also be controlled.

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