X-Ray Fluorescence Spectroscopy
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X-Ray Fluorescence (XRF)
XRF is an elemental and chemical analysis tool. Handheld XRF is particularly useful for inspection and quick nondestructive analysis of large objects such as automotive parts, archaeological, art objects, or forensic samples. In XRF, the sample is excited by an incident X-day beam that interacts with the atoms in the sample. The sample emits X-rays characteristic of its chemical and elemental makeup. Analysis of the emitted X-ray radiation provides the chemical composition of the material.
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Common Uses
- Atomic layer deposited thin film thickness measurement for semiconductor memory applications
- Inspections of parts and corrosion detection in automotive
- Impurities and contaminants in trace amounts in materials
- Elemental analysis of large area wafers or large samples
- Nondestructive paint analysis in art objects
- Mineral chemical composition analysis in the field
- Archeological sample chemical analysis
- Impurities in pharmaceutical drugs and food products
XRF Advantages
- XRF works on conductive and nonconductive samples both
- Detection of elements in very low concentrations – trace amounts
- Quick analysis – almost instant results
- No sample preparation required
- Angstrom level thin film thickness measurement
XRF Limitations
- Quantification of results requires a more complicated procedure using reference standards
- Useful only for elements from B to U
- Handheld XRF cannot detect elements below Mg reliably
Industries
- Oil and Gas
- Food Products
- Chemical
- Pharmaceutical
- Organic Semiconductors
- Nanotechnology
- Additive Manufacturing
- Advanced Materials
- Automotive
- Energy Storage and Batteries
- LED and Display
- Mining and Minerals
X-Ray Fluorescence (XRF) Laboratories
- Evans Analytical Group – EAG laboratories
- Covalent Metrology
- Archaeometry Laboratory
- Triclinic Laboratory
- Element Materials Analysis
- Intertek
- EMSL
- Washington Mills
More Details
Common Uses
- Atomic layer deposited thin film thickness measurement for semiconductor memory applications
- Inspections of parts and corrosion detection in automotive
- Impurities and contaminants in trace amounts in materials
- Elemental analysis of large area wafers or large samples
- Nondestructive paint analysis in art objects
- Mineral chemical composition analysis in the field
- Archeological sample chemical analysis
- Impurities in pharmaceutical drugs and food products
Advantages
- XRF works on conductive and nonconductive samples both
- Detection of elements in very low concentrations – trace amounts
- Quick analysis – almost instant results
- No sample preparation required
- Angstrom level thin film thickness measurement
Limitations
- Quantification of results requires a more complicated procedure using reference standards
- Useful only for elements from B to U
- Handheld XRF cannot detect elements below Mg reliably
Industries
- Oil and Gas
- Food Products
- Chemical
- Pharmaceutical
- Organic Semiconductors
- Nanotechnology
- Additive Manufacturing
- Advanced Materials
- Automotive
- Energy Storage and Batteries
- LED and Display
- Mining and Minerals
XRF Laboratories
- Evans Analytical Group – EAG laboratories
- Covalent Metrology
- Archaeometry Laboratory
- Triclinic Laboratory
- Element Materials Analysis
- Intertek
- EMSL
- Washington Mills
More Details
FEATURED SERVICES
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Transmission Electron Microscopy (TEM)
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Secondary Ion Mass Spectroscopy (SIMS)
Secondary Ion Mass Spectroscopy or SIMS is a tool for composition analysis of metals, semiconductors, polymers, biomaterials, minerals, rocks, and ceramics.
Profilometry
Profilometry is the measurement of surface topography. It is used to measure surface roughness, coating thickness variation, flatness, surface curvature,
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FAQ on X-ray Fluorescence (XRF)
Our network of material testing labs regularly provides portable and laboratory X-ray Fluorescence (XRF) testing services, including high-throughput testing, in-line measurements, etc.
Wavelength dispersive X-ray Fluorescence (XRF) analysis of materials starts at $400/hour.
XRF can be used to determine the chemical composition of solid, liquid, powdered samples. It is frequently used for contamination detection, qualitative and quantitative analysis, thickness and composition measurements in thin-films and coatings, etc.
Both operate on the same working principles of X-ray scattering. While XRF provides the chemical composition of the sample and is used for rapid surface analysis of samples, XRD is often used to identify the crystalline phases, differentiate oxidation states, and obtain other crystallographic information.